Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films
Panzer, M.A., Shandalov, M., Rowlette, J.A., Oshima, Y., Yi Wei Chen, McIntyre, P.C., Goodson, K.E.
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Thermal Boundary Resistance Measurements for Phase-Change Memory Devices
Reifenberg, J.P., Kuo-Wei Chang, Panzer, M.A., Sangbum Kim, Rowlette, J.A., Asheghi, M., Wong, H.-S.P., Goodson, K.E.
Published in IEEE electron device letters (01.01.2010)
Published in IEEE electron device letters (01.01.2010)
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