Theoretical analysis and experimental characterization of the dummy-gated VDMOSFET
Shuming Xu, Changhong Ren, Liang, Y.C., Pan-Dow Foo, Sin, J.K.O.
Published in IEEE transactions on electron devices (01.09.2001)
Published in IEEE transactions on electron devices (01.09.2001)
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Journal Article
RF LDMOSFET with graded gate structure
Shuming Xu, Pan Dow Foo
Published in 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) (1999)
Published in 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) (1999)
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Conference Proceeding