On the Thermal Models for Resistive Random Access Memory Circuit Simulation
Roldán, Juan B, González-Cordero, Gerardo, Picos, Rodrigo, Miranda, Enrique, Palumbo, Félix, Jiménez-Molinos, Francisco, Moreno, Enrique, Maldonado, David, Baldomá, Santiago B, Moner Al Chawa, Mohamad, de Benito, Carol, Stavrinides, Stavros G, Suñé, Jordi, Chua, Leon O
Published in Nanomaterials (Basel, Switzerland) (11.05.2021)
Published in Nanomaterials (Basel, Switzerland) (11.05.2021)
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Journal Article
SPICE Simulation of RRAM-Based Cross-Point Arrays Using the Dynamic Memdiode Model
Aguirre, Fernando L., Pazos, Sebastián M., Palumbo, Félix, Suñé, Jordi, Miranda, Enrique
Published in Frontiers in physics (23.09.2021)
Published in Frontiers in physics (23.09.2021)
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Journal Article
Minimization of the Line Resistance Impact on Memdiode-Based Simulations of Multilayer Perceptron Arrays Applied to Pattern Recognition
Aguirre, Fernando Leonel, Gomez, Nicolás M., Pazos, Sebastián Matías, Palumbo, Félix, Suñé, Jordi, Miranda, Enrique
Published in Journal of low power electronics and applications (01.03.2021)
Published in Journal of low power electronics and applications (01.03.2021)
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Journal Article
A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐k, and Layered Dielectrics
Palumbo, Felix, Wen, Chao, Lombardo, Salvatore, Pazos, Sebastian, Aguirre, Fernando, Eizenberg, Moshe, Hui, Fei, Lanza, Mario
Published in Advanced functional materials (01.05.2020)
Published in Advanced functional materials (01.05.2020)
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Journal Article
Dielectric breakdown mechanisms in gate oxides
Lombardo, Salvatore, Stathis, James H., Linder, Barry P., Pey, Kin Leong, Palumbo, Felix, Tung, Chih Hang
Published in Journal of applied physics (15.12.2005)
Published in Journal of applied physics (15.12.2005)
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Journal Article
Decoupling the sequence of dielectric breakdown in single device bilayer stacks by radiation-controlled, spatially localized creation of oxide defects
Aguirre, Fernando Leonel, Ranjan, Alok, Raghavan, Nagarajan, Padovani, Andrea, Pazos, Sebastián Matías, Vega, Nahuel, Müller, Nahuel, Debray, Mario, Molina-Reyes, Joel, Pey, Kin Leong, Palumbo, Félix
Published in Applied physics express (01.12.2021)
Published in Applied physics express (01.12.2021)
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Journal Article
Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults
Aguirre, Fernando L., Pazos, Sebastián M., Palumbo, Félix, Morell, Antoni, Suñé, Jordi, Miranda, Enrique
Published in Electronics (Basel) (01.10.2021)
Published in Electronics (Basel) (01.10.2021)
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Journal Article
Analytic circuit model for thermal drying behavior of electronic inks
Maroli, Gabriel, Boyeras, Santiago, Giannetta, Hernan, Pazos, Sebastian, Gak, Joel, Oliva, Alejandro Raúl, Volpe, María Alicia, Julian, Pedro Marcelo, Palumbo, Felix
Published in Frontiers in electronics (Online) (06.01.2023)
Published in Frontiers in electronics (Online) (06.01.2023)
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Journal Article
Heavy-ion micro-beam use for transient fault injection in VLSI circuits
Sondon, Santiago, Mandolesi, Pablo, Julian, Pedro, Vega, Nahuel, Palumbo, Felix, De Bray, Mario
Published in 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS) (01.05.2014)
Published in 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS) (01.05.2014)
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Conference Proceeding
Piecewise-linear Modelling of CMOS Gates Propagation Delay as a Function of PVT Variations and Aging
Aguirre, Fernando L., Palumbo, Felix, Julian, Pedro
Published in 2021 Argentine Conference on Electronics (CAE) (11.03.2021)
Published in 2021 Argentine Conference on Electronics (CAE) (11.03.2021)
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Conference Proceeding
A Geometric Modeling Approach for Flexible, Printed Square Planar Inductors under Stretch
Maroli, Gabriel, Fontana, Andres, Pazos, Sebastian M., Palumbo, Felix, Julian, Pedro
Published in 2021 Argentine Conference on Electronics (CAE) (11.03.2021)
Published in 2021 Argentine Conference on Electronics (CAE) (11.03.2021)
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Conference Proceeding
Standards for the Characterization of Endurance in Resistive Switching Devices
Lanza, Mario, Waser, Rainer, Ielmini, Daniele, Yang, J. Joshua, Goux, Ludovic, Suñe, Jordi, Kenyon, Anthony Joseph, Mehonic, Adnan, Spiga, Sabina, Rana, Vikas, Wiefels, Stefan, Menzel, Stephan, Valov, Ilia, Villena, Marco A, Miranda, Enrique, Jing, Xu, Campabadal, Francesca, Gonzalez, Mireia B, Aguirre, Fernando, Palumbo, Felix, Zhu, Kaichen, Roldan, Juan Bautista, Puglisi, Francesco Maria, Larcher, Luca, Hou, Tuo-Hung, Prodromakis, Themis, Yang, Yuchao, Huang, Peng, Wan, Tianqing, Chai, Yang, Pey, Kin Leong, Raghavan, Nagarajan, Dueñas, Salvador, Wang, Tao, Xia, Qiangfei, Pazos, Sebastian
Published in ACS nano (23.11.2021)
Published in ACS nano (23.11.2021)
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Journal Article
Physical mechanism of progressive breakdown in gate oxides
Palumbo, Felix, Lombardo, Salvatore, Eizenberg, Moshe
Published in Journal of applied physics (14.06.2014)
Published in Journal of applied physics (14.06.2014)
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Journal Article
High‐Temporal‐Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h‐BN Memristors
Pazos, Sebastian, Becker, Thales, Villena, Marco Antonio, Zheng, Wenwen, Shen, Yaqing, Yuan, Yue, Alharbi, Osamah, Zhu, Kaichen, Roldán, Juan Bautista, Wirth, Gilson, Palumbo, Felix, Lanza, Mario
Published in Advanced functional materials (01.04.2024)
Published in Advanced functional materials (01.04.2024)
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Journal Article
Charge trapping effects on Metal-Gate/High-k/III-V MOS devices assessed through C-V hysteresis
Pazos, Sebastian M., Aguirre, Fernando L., Palumbo, Felix
Published in 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA) (01.07.2017)
Published in 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA) (01.07.2017)
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Conference Proceeding
Band structure and electronic transport across Ta2O5/Nb:SrTiO3 interfaces
Miron, Dror, Cohen-Azarzar, Dana, Segev, Noa, Baskin, Maria, Palumbo, Felix, Yalon, Eilam, Kornblum, Lior
Published in Journal of applied physics (28.07.2020)
Published in Journal of applied physics (28.07.2020)
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Journal Article
Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller
Pazos, Sebastian, Zheng, Wenwen, Zanotti, Tommaso, Aguirre, Fernando, Becker, Thales, Shen, Yaqing, Zhu, Kaichen, Yuan, Yue, Wirth, Gilson, Puglisi, Francesco Maria, Roldán, Juan Bautista, Palumbo, Felix, Lanza, Mario
Published in Nanoscale (02.02.2023)
Published in Nanoscale (02.02.2023)
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Journal Article