Product reliability and qualifications for high consequence/low volume integrated circuits: Discussion group, Oct. 10, 2017
Haase, Gaddi, Yang-Scharlotta, Jean, Siddiqui, Jeff, LaRow, Charles, Pozder, Scott, Paliwoda, Peter, Hogan, Matthew, May, James
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Reliability and modeling: What to simulate and how?
Zhang, Rui, Verzellesi, Giovanni, Puzzilli, Giuseppina, Puschkarsky, Katja, LaRow, Charles, Shluger, Alexander, Tkachev, Yuri, Villena, Marco A., Yang, Kexin, Metaev, Elnatan, Pesic, Milan, Lloyd, Jim, Ring, Matt, Paliwoda, Peter, Tan, Sheldon, Young, Chadwin
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
An Optimized CMOS Gilbert Mixer Using Inter-Stage Inductance for Ultra Wideband Receivers
Paliwoda, Peter, Hella, Mona
Published in 2006 49th IEEE International Midwest Symposium on Circuits and Systems (01.08.2006)
Published in 2006 49th IEEE International Midwest Symposium on Circuits and Systems (01.08.2006)
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Conference Proceeding
Memory with read circuit for current-to-voltage slope characteristic-based sensing and method
Paliwoda, Peter C, Nour, Mohamed A, Kirihata, Toshiaki, Min, Byoung-Woon B
Year of Publication 05.07.2022
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Year of Publication 05.07.2022
Patent
Wafer level high temperature reliability study by backside probing f or a 50um thin TSV wafer
Premachandran, C. S., Ranjan, Rakesh, Agarwal, Rahul, Yap Sing Fui, Paliwoda, Peter, Sarasvathi, Thangaraju, Arfa, Gondal, Patrick, Justison, Mahadeva Iyer, Natarajan
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
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Conference Proceeding
Speicher mit Leseschaltung für Strom-Spannungs-Steigungskennlinie-basiertes Abtasten und Verfahren
Paliwoda, Peter C, Nour, Mohamed A, Kirihata, Toshiaki, Min, Byoung-Woon B
Year of Publication 17.11.2022
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Year of Publication 17.11.2022
Patent
Testing molecular devices in CMOS/nano integrated circuits
Paliwoda, P.C., Maragal, D.S., Rose, G.S.
Published in 2007 7th IEEE Conference on Nanotechnology (IEEE NANO) (01.08.2007)
Published in 2007 7th IEEE Conference on Nanotechnology (IEEE NANO) (01.08.2007)
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Conference Proceeding
Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability
Paliwoda, Peter, Chbili, Zakariae, Kerber, Andreas, Nigam, Tanya, Nagahiro, K., Cimino, Salvatore, Toledano-Luque, Maria, Pantisano, Luigi, Min, Byoung Woon, Misra, Durgamadhab
Published in IEEE transactions on device and materials reliability (01.06.2019)
Published in IEEE transactions on device and materials reliability (01.06.2019)
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Magazine Article
Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation
Paliwoda, Peter, Manik, Prashanth P., Singh, Dhruv, Chbili, Zakariae, Kerber, Andreas, Johnson, Jeffrey, Misra, Durgamadhab
Published in IEEE transactions on device and materials reliability (01.06.2018)
Published in IEEE transactions on device and materials reliability (01.06.2018)
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Magazine Article