by Toledano-Luque, M., Paliwoda, P., Nour, M., Kauerauf, T., Min, B., Bossu, G., Siddabathula, M., Nigam, T.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)

by Pantisano, Luigi, Srinivasan, Purushothaman, Kim, Taehoon, Chu, Tao, Ozbek, Merve, Zainuddin, Abu Naser, Hasanuzzaman, M., Dag, Sefa, Paliwoda, P., Bajaj, M., Kannan, Balaji, Kota, Murali, Zhao, Kai
Published in Microelectronic engineering (25.06.2017)

by Paliwoda, P., Rabie, M.A., Restrepo, O.D., Silva, E.C., Kaltalioglu, E., Guarin, F., Barnett, K., Johnson, J., Taylor, W., Boenke, M., Min, B.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Singh, D., Restrepo, O. D., Manik, P. P., Mavilla, N. Rao, Zhang, H., Paliwoda, P., Pinkett, S., Deng, Y., Silva, E. Cruz, Johnson, J. B., Bajaj, M., Furkay, S., Chbili, Z., Kerber, A., Christiansen, C., Narasimha, S., Maciejewski, E., Samavedam, S., Lin, C.-H.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Nigam, T., Paliwoda, P., Wang, X., Kerber, A.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Paliwoda, P., Toledano-Luque, M., Nigam, T., Guarin, F., Nour, M., Cimino, S., Pantisano, L., Gupta, A., Gonzalez, O. H., Hauser, M., Liu, W., Vayshenker, A., Ioannou, D., Lee, D., Jiang, L., Yee, P., Rauch, S., Min, B.
Published in 2020 IEEE 29th North Atlantic Test Workshop (NATW) (01.06.2020)

by Toledano-Luque, M., Zhu, B., Min, B., Nigam, T., Srinivasan, P., Paliwoda, P., Cimino, S., Chbili, Z., Mahmud, M. Iqbal, Gupta, A., Shen, T., Kauerauf, T.
Published in 2019 Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2019)

by Paliwoda, P., Chbili, Z., Kerber, A., Singh, D., Misra, D.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Paliwoda, P., Chbili, Z., Kerber, A., Gondal, A., Misra, D.
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)

by Tan, T. L., Zhou, P., Cao, L., Tan, P. Y., Paliwoda, P., Eng, C. W.
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)

by Soja, Piotr, Paliwoda-P kosz, Gra yna
Published in Industrial management + data systems (22.05.2009)

by Kerber, A., Srinivasan, P., Cimino, S., Paliwoda, P., Chandrashekhar, S., Chbili, Z., Uppal, S., Ranjan, R., Mahmud, M.-I, Singh, D., Manik, P. P., Johnson, J., Guarin, F., Nigam, T., Parameshwaran, B.
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Singh, D., Nagahiro, K., Manik, P.P, Cimino, S., Misra, D.
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)

by Yao, G., Han, Z. G., Yap, H. K., Yuen, F. P., Tan, C. P., Tan, P. Y., Paliwoda, P., Eng, C. W.
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)

by Paliwoda, Peter, Misra, Durga
Published in ECS transactions (01.01.2011)

by Liu, Y., Chi, M. H., Mittal, A., Aluri, G., Uppal, S., Paliwoda, P., Banghart, E., Korablev, K., Liu, B., Nam, M., Eller, M., Samavedam, S.
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)