A Study on Defect Inspection System using Efficient Thresholding Method
Pak, Myeongsuk, Kim, Sanghoon
Published in International Information Institute (Tokyo). Information (01.02.2016)
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Published in International Information Institute (Tokyo). Information (01.02.2016)
Journal Article
A review of deep learning in image recognition
Pak, Myeongsuk, Kim, Sanghoon
Published in 2017 4th International Conference on Computer Applications and Information Processing Technology (CAIPT) (01.08.2017)
Published in 2017 4th International Conference on Computer Applications and Information Processing Technology (CAIPT) (01.08.2017)
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Conference Proceeding
2D Barcode Localization Using Multiple Features Mixture Model
Pak, Myeongsuk, Kim, Sanghoon
Published in Advances in Computer Science and Ubiquitous Computing (18.12.2015)
Published in Advances in Computer Science and Ubiquitous Computing (18.12.2015)
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Book Chapter