DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG
Hsieh, Shih-An, Wang, Ying-Hsu, Shen, Ting-Yu, Huang, Kuan-Yen, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
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Journal Article
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits
Chen, Tsai-Chieh, Pai, Chia-Cheng, Hsieh, Yi-Zhan, Tseng, Hsiao-Yin, Chien-Mo, James, Liu, Tsung-Te, Chiu, I-Wei
Published in Journal of electronic testing (01.08.2021)
Published in Journal of electronic testing (01.08.2021)
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Journal Article
Test methodology for PCHB/PCFB Asynchronous Circuits
Shen, Ting-Yu, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo, Pan, Samuel
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Efficient Multi-Layer Obstacle-Avoiding Region-to-Region Rectilinear Steiner Tree Construction
Wang, Run-Yi, Pai, Chia-Cheng, Wang, Jun-Jie, Wen, Hsiang-Ting, Pai, Yu-Cheng, Chang, Yao-Wen, C.M. Li, James, Jiang, Jie-Hong
Published in 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) (01.06.2018)
Published in 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) (01.06.2018)
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Conference Proceeding