Search Results - "Pahk, Heui Jae" :: K.UTB vyhledávací portál

Fast and Reliable Measurement of Thin Film Thickness Profile Based on Wavelet Transform in Spectrally Resolved White-Light Interferometry

by Kim, Min-Gab, Pahk, Heui-Jae
Published in International journal of precision engineering and manufacturing (01.02.2018)

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Active Contour Method Based Sub-pixel Critical Dimension Measurement of Thin Film Transistor Liquid Crystal Display (TFT-LCD) Patterns

by Lee, Jeong Hoon, Kim, Tai-Wook, Ku, Dong Hun, Pahk, Heui Jae
Published in International journal of precision engineering and manufacturing (01.05.2020)

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A Method for Improving Resolution and Critical Dimension Measurement of an Organic Layer Using Deep Learning Superresolution

by Kim, Sangyun, Pahk, Heui Jae
Published in Current optics and photonics (2018)

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Enhancing Battery Exterior Defect Inspection Accuracy through Defect-Background Separated GAN Development

by Ku, Donghun, Pahk, Heui Jae
Published in IEEE access (01.01.2024)

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Thickness Measurement of a Transparent Thin Film Using Phase Change in White-Light Phase-Shift Interferometry

by Kim, Jaeho, Kim, Kwangrak, Pahk, Heui Jae
Published in Current optics and photonics (2017)

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Fast Analysis of Film Thickness in Spectroscopic Reflectometry using Direct Phase Extraction

by Kim, Kwangrak, Kwon, Soonyang, Pahk, Heui Jae
Published in Current optics and photonics (2017)

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Precise Edge Detection Method Using Sigmoid Function in Blurry and Noisy Image for TFT-LCD 2D Critical Dimension Measurement

by Lee, Seung Woo, Lee, Sin Yong, Pahk, Heui Jae
Published in Current optics and photonics (2018)

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Generating a True Color Image with Data from Scanning White-Light Interferometry by Using a Fourier Transform

by Kim, Jin-Yong, Kim, Seungjae, Kim, Min-Gyu, Pahk, Heui Jae
Published in Current optics and photonics (2019)

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Improvement of PS Measurement by Phase Compensation Method and Profile Fitting Method in White Light Phase Shifting Interferometry : Retraction

by Ku, Dong Hun, Lee, Sun Mi, Roh, Ha Na, Kim, Tai-Wook, Pahk, Heui Jae
Published in Current optics and photonics (2019)

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Accurate Roughness Measurement Using a Method for Evaluation and Interpolation of the Validity of Height Data from a Scanning White-light Interferometer

by Kim, Namyoon, Lee, Seung Woo, I, Yongjun, Pahk, Heui-Jae
Published in Current optics and photonics (2017)

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Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry

by Hwang, Young-Min, Yoon, Sung-Won, Kim, Jung-Hwan, Kim, Souk, Pahk, Heui-Jae
Published in Optics and lasers in engineering (01.02.2008)

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Development of the precision planar motor stage using a new magnet array and robust control with the parametric uncertainty model

by Shin, Hyun-Jang, Pahk, Heui-Jae
Published in International journal of advanced manufacturing technology (01.07.2007)

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A new technique for volumetric error assessment of CNC machine tools incorporating ball bar measurement and 3D volumetric error model

by Jae Pahk, Heui, Sam Kim, Young, Hee Moon, Joon
Published in International journal of machine tools & manufacture (01.11.1997)

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DEVICE FOR MEASURING REFLECTANCE AND INCIDENT LIGHT QUANTITY

by LEE, Sin Yong, PAHK, Heui Jae
Year of Publication 09.12.2021

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Coaxial Spectroscopic Imaging Ellipsometer

by LEE SEUNG WOO, PAHK HEUI JAE
Year of Publication 22.10.2021

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3 The thickness measurement method using a three-dimensional reflectance surface

by CHO YEONG CHAN, LEE SEUNG WOO, PAHK HEUI JAE
Year of Publication 05.01.2023

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Ultra-short laser patterning of thin-film CIGS solar cells through glass substrate

by Kim, Tai-Wook, Lee, Jeong-Yun, Kim, Do-Hun, Pahk, Heui-Jae
Published in International journal of precision engineering and manufacturing (01.08.2013)

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