Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM
Son, D., Kim, G.-J., Kim, J., Lee, N., Kim, K., Pae, S.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Get full text
Conference Proceeding
Reliability Improvement with Optimized BEOL Process in Advanced DRAM
Lee, J.H., Woo, B.W., Lee, Y.M., Lee, N.H., Lee, SH, Lee, YS, Kim, HS, Pae, S.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Reliability Characterization of HBM featuring \text+\text Logic Chip with Multi-stacked DRAMs
Ha, Sungmock, Lee, S., Bae, GH, Lee, DS, Kim, S.H., Woo, BW, Lee, N-H, Lee, YS, Pae, S.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology
Lee, S., Lee, N-H, Kim, G-J, Ahn, J., Kim, IH, Ha, S., Rhee, S., Bae, GH, Lee, KW, Lee, YS, Ko, SB, Pae, S.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Get full text
Conference Proceeding
Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC
Lee, S., Lee, N-H, Lee, KW, Kim, JH, Jin, JH, Lee, YS, Hwang, YC, Kim, HS, Pae, S.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology
Lee, N-H, Lee, S., Kim, S-H, Kim, G-J, Lee, KW, Lee, YS, Hwang, YC, Kim, HS, Pae, S.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Get full text
Conference Proceeding
Thermo-Mechanical Reliability Characteristics of 8H HBM3
Bae, Jinsoo, Noh, HG, Yoo, SJ, Choi, IJ, Bae, GH, Shim, YM, Lee, SG, Jang, H., Lee, SM, Chang, GH, Kwon, KS, Yoon, CB, Lee, YS, Pyun, JW, Kim, JH, Ko, SB, Hwang, YC, Pae, S.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Get full text
Conference Proceeding
Energy dissipation capacity of an unstiffened extended end-plate connection with a SMA plate
Yang, J. G., Kim, J. W., Lee, J. H., Kang, J. S., Pae, D. S.
Published in International journal of steel structures (01.12.2016)
Published in International journal of steel structures (01.12.2016)
Get full text
Journal Article
Reliability of Industrial grade Embedded-STT-MRAM
Ji, Y., Goo, H., Lim, J., Jeong, T. Y., Uemura, T., Kim, G. R., Seo, B. I., Lee, S., Park, G., Jo, J., Han, S. I., Lee, K., Lee, J., Hwang, S. H., Lee, D. S., Pyo, S., Jung, H. T., Han, S. H., Noh, S., Suh, K., Yoon, S. Y., Nam, H., Hwang, H., Jiang, H., Kim, J. W., Kwon, D., Song, Y. J., Koh, K. H., Rhee, H. S., Pae, S., Lee, E.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Get full text
Conference Proceeding
A Comprehensive Reliability Characterization of 5G SoC Mobile Platform Featuring 7nm EUV Process Technology
Jin, M., Kim, K., Kim, B., Kim, M., Kwon, S., Cho, Y., Lee, M., Jeong, T., Yeo, M., Choi, K., Sagong, H., Uemura, T., Jiang, H., Mun, D., Kim, W., Kwon, E., Kim, Y., Shim, H., Nam, H., Park, J., Rhee, H., Pae, S., Lee, B.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Get full text
Conference Proceeding
BTI reliability of 45 nm high-K + metal-gate process technology
Pae, S., Agostinelli, M., Brazier, M., Chau, R., Dewey, G., Ghani, T., Hattendorf, M., Hicks, J., Kavalieros, J., Kuhn, K., Kuhn, M., Maiz, J., Metz, M., Mistry, K., Prasad, C., Ramey, S., Roskowski, A., Sandford, J., Thomas, C., Thomas, J., Wiegand, C., Wiedemer, J.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Get full text
Conference Proceeding
Subungual glomus tumours of the hand: diagnosis and outcome of the transungual approach
Lee, I J, Park, D H, Park, M C, Pae, N S
Published in The Journal of hand surgery, European volume (01.10.2009)
Published in The Journal of hand surgery, European volume (01.10.2009)
Get more information
Journal Article
1Gbit High Density Embedded STT-MRAM in 28nm FDSOI Technology
Lee, K., Kim, W. J., Lee, J. H., Bae, B. J., Park, J. H., Kim, I. H., Seo, B. Y., Han, S. H., Ji, Y., Jung, H. T., Park, S. O., Bak, J. H., Kwon, O. I., Kye, J. W., Kim, Y. D., Pae, S. W., Song, Y. J., Jeong, G. T., Hwang, K. H., Koh, G. H., Kang, H. K., Jung, E. S., Kim, Y. J., Kim, C. K., Antonyan, A., Chang, D. H., Hwang, S. H., Lee, G. W., Ji, N. Y.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Get full text
Conference Proceeding
From WLR to product reliability and qualifications in the 3D transistor era
Pae, S., Sagong, H.C., Liu, C., Kim, J., Jin, M., Shim, J., Kim, Y., Jo, J., Park, J.K., Choi, M., Kim, S., Kim, W., Park, S., Shin, S., Park, J.
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Get full text
Conference Proceeding
Journal Article
Endoscopy-assisted ultrasonic surgical aspiration of axillary osmidrosis: A retrospective review of 896 consecutive patients from 1998 to 2004
Yoo, W.M., Pae, N.S., Lee, S.J., Roh, T.S., Chung, S., Tark, K.C.
Published in Journal of plastic, reconstructive & aesthetic surgery (01.01.2006)
Published in Journal of plastic, reconstructive & aesthetic surgery (01.01.2006)
Get full text
Journal Article