Thin Si channel Back Enhanced (BE) SOI pMOSFET Photodetector under different bias conditions
Padovese, J.A., Rangel, R.C., Sasaki, K.R.A., Martino, J.A.
Published in 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2019)
Published in 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2019)
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