Search Results - "Pacheco‐Sanchez, Anibal" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Exploiting Ambipolarity in Graphene Field‐Effect Transistors for Novel Designs on High‐Frequency Analog Electronics

Exploiting Ambipolarity in Graphene Field‐Effect Transistors for Novel Designs on High‐Frequency Analog Electronics

by Pasadas, Francisco, Medina‐Rull, Alberto, Ruiz, Francisco G., Ramos‐Silva, Javier Noe, Pacheco‐Sanchez, Anibal, Pardo, Mari Carmen, Toral‐Lopez, Alejandro, Godoy, Andrés, Ramírez‐García, Eloy, Jiménez, David, Marin, Enrique G.
Published in Small (Weinheim an der Bergstrasse, Germany) (01.12.2023)

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Compact Modeling Technology for the Simulation of Integrated Circuits Based on Graphene Field‐Effect Transistors

Compact Modeling Technology for the Simulation of Integrated Circuits Based on Graphene Field‐Effect Transistors

by Pasadas, Francisco, Feijoo, Pedro C., Mavredakis, Nikolaos, Pacheco‐Sanchez, Aníbal, Chaves, Ferney A., Jiménez, David
Published in Advanced materials (Weinheim) (01.12.2022)

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Investigating the Device Performance Variation of a Buried Locally Gated Al/Al2O3 Graphene Field-Effect Transistor Process

Investigating the Device Performance Variation of a Buried Locally Gated Al/Al2O3 Graphene Field-Effect Transistor Process

by Huang, Tzu-Jung, Ankolekar, Adheesh, Pacheco-Sanchez, Anibal, Puchades, Ivan
Published in Applied sciences (01.06.2023)

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Static and small-signal modeling of radiofrequency hexagonal boron nitride switches

Static and small-signal modeling of radiofrequency hexagonal boron nitride switches

by Pacheco-Sanchez, Anibal, Jordan-Garcia, Omar, Ramirez-Garcia, Eloy, Jimenez, David
Published in IEEE journal of the Electron Devices Society (01.01.2023)

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A Semiphysical Large-Signal Compact Carbon Nanotube FET Model for Analog RF Applications

A Semiphysical Large-Signal Compact Carbon Nanotube FET Model for Analog RF Applications

by Schroter, Michael, Haferlach, Max, Pacheco-Sanchez, Anibal, Mothes, Sven, Sakalas, Paulius, Claus, Martin
Published in IEEE transactions on electron devices (01.01.2015)

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Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs

Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs

by Pacheco-Sanchez, Anibal, Claus, Martin
Published in IEEE transactions on nanotechnology (2020)

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Contact resistance extraction of graphene FET technologies based on individual device characterization

Contact resistance extraction of graphene FET technologies based on individual device characterization

by Pacheco-Sanchez, Anibal, Feijoo, Pedro C., Jiménez, David
Published in Solid-state electronics (01.10.2020)

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A Scalable Compact Model for the Static Drain Current of Graphene FETs

A Scalable Compact Model for the Static Drain Current of Graphene FETs

by Mavredakis, Nikolaos, Pacheco-Sanchez, Anibal, Txoperena, Oihana, Torres, Elias, Jimenez, David
Published in IEEE transactions on electron devices (01.01.2024)

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An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors

An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors

by Pacheco-Sanchez, Anibal, Mavredakis, Nikolaos, Feijoo, Pedro C., Jimenez, David
Published in IEEE transactions on electron devices (01.07.2022)

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A Taylor Series Approximation Model for Characterizing the Output Resistance of a GFET

A Taylor Series Approximation Model for Characterizing the Output Resistance of a GFET

by Ribero-Figueroa, Xiomara, Pacheco-Sanchez, Anibal, Huang, Tzu-Jung, Jimenez, David, Puchades, Ivan, Torres-Torres, Reydezel
Published in IEEE transactions on electron devices (01.11.2024)

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Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

by Pacheco-Sanchez, Anibal, Bejenari, Igor, Schroter, Michael
Published in IEEE transactions on electron devices (01.11.2019)

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A Small-Signal GFET Equivalent Circuit Considering an Explicit Contribution of Contact Resistances

A Small-Signal GFET Equivalent Circuit Considering an Explicit Contribution of Contact Resistances

by Pacheco-Sanchez, Anibal, Ramos-Silva, Javier N., Ramirez-Garcia, Eloy, Jimenez, David
Published in IEEE microwave and wireless components letters (01.01.2021)

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Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

by Pacheco-Sanchez, Anibal, Mavredakis, Nikolaos, Feijoo, Pedro C., Wei, Wei, Pallecchi, Emiliano, Happy, Henri, Jimenez, David
Published in IEEE transactions on electron devices (01.12.2020)

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Contact resistance extraction methods for short- and long-channel carbon nanotube field-effect transistors

Contact resistance extraction methods for short- and long-channel carbon nanotube field-effect transistors

by Pacheco-Sanchez, Anibal, Claus, Martin, Mothes, Sven, Schröter, Michael
Published in Solid-state electronics (01.11.2016)

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Practical Mobility Estimations for Transistors With 1-D Channels Based on the Landauer-Büttiker Equation

Practical Mobility Estimations for Transistors With 1-D Channels Based on the Landauer-Büttiker Equation

by Pacheco-Sanchez, Anibal, Claus, Martin
Published in IEEE transactions on nanotechnology (2019)

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Physics-based bias-dependent compact modeling of 1/ noise in single- to few-layer 2D-FETs

Physics-based bias-dependent compact modeling of 1/ noise in single- to few-layer 2D-FETs

by Mavredakis, Nikolaos, Pacheco-Sanchez, Anibal, Alam, Md Hasibul, Guimerà-Brunet, Anton, Martinez, Javier, Garrido, Jose Antonio, Akinwande, Deji, Jiménez, David
Published in Nanoscale (06.04.2023)

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Corrections to "Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs" [2021 459-465]

Corrections to "Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs" [2021 459-465]

by Weimer, Christoph, Pacheco-Sanchez, Anibal, Trommer, Jens, Schroter, Michael
Published in IEEE transactions on nanotechnology (2021)

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Gate Tunable Lateral 2D pn Junctions: An Analytical Study of Its Electrostatics

Gate Tunable Lateral 2D pn Junctions: An Analytical Study of Its Electrostatics

by Chaves, Ferney A., Pacheco-Sanchez, Anibal, Jimenez, David
Published in IEEE transactions on nanotechnology (01.01.2023)

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Investigating the Device Performance Variation of a Buried Locally Gated Al/Al[sub.2]O[sub.3] Graphene Field-Effect Transistor Process

Investigating the Device Performance Variation of a Buried Locally Gated Al/Al[sub.2]O[sub.3] Graphene Field-Effect Transistor Process

by Huang, Tzu-Jung, Ankolekar, Adheesh, Pacheco-Sanchez, Anibal, Puchades, Ivan
Published in Applied sciences (01.06.2023)

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Characterization of the Intrinsic and Extrinsic Resistances of a Microwave Graphene FET Under Zero Transconductance Conditions

Characterization of the Intrinsic and Extrinsic Resistances of a Microwave Graphene FET Under Zero Transconductance Conditions

by Ribero-Figueroa, Xiomara, Pacheco-Sanchez, Anibal, Mansouri, Aida, Kumar, Pankaj, Habibpour, Omid, Zirath, Herbert, Sordan, Roman, Pasadas, Francisco, Jimenez, David, Torres-Torres, Reydezel
Published in IEEE transactions on electron devices (01.11.2023)

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