Atomic force microscopy of partially polished and epi-ready c-plane GaN substrates obtained by an ammonothermal method
Serafinczuk, Jaros aw, Jó wiak, Grzegorz, Pa etko, Piotr, Kudrawiec, Robert, Kucharski, Robert, Zajac, Marcin, Gotszalk, Teodor Pawe
Published in Applied physics express (01.05.2014)
Published in Applied physics express (01.05.2014)
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