A 22nm high performance and low-power CMOS technology featuring fully-depleted tri-gate transistors, self-aligned contacts and high density MIM capacitors
Auth, C., Allen, C., Blattner, A., Bergstrom, D., Brazier, M., Bost, M., Buehler, M., Chikarmane, V., Ghani, T., Glassman, T., Grover, R., Han, W., Hanken, D., Hattendorf, M., Hentges, P., Heussner, R., Hicks, J., Ingerly, D., Jain, P., Jaloviar, S., James, R., Jones, D., Jopling, J., Joshi, S., Kenyon, C., Liu, H., McFadden, R., McIntyre, B., Neirynck, J., Parker, C., Pipes, L., Post, I., Pradhan, S., Prince, M., Ramey, S., Reynolds, T., Roesler, J., Sandford, J., Seiple, J., Smith, P., Thomas, C., Towner, D., Troeger, T., Weber, C., Yashar, P., Zawadzki, K., Mistry, K.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
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Conference Proceeding
A Reliability Overview of Intel's 10+ Logic Technology
Grover, R., Acosta, T., AnDyke, C., Armagan, E., Auth, C., Chugh, S., Downes, K., Hattendorf, M., Jack, N., Joshi, S., Kasim, R., Leatherman, G., Lee, S.-H., Lin, C.-Y., Madhavan, A., Mao, H., Lowrie, A., Martin, G., McPherson, G., Nayak, P., Neale, A., Nminibapiel, D., Orr, B., Palmer, J., Pelto, C., Poon, S. S., Post, I., Pramanik, T., Rahman, A., Ramey, S., Seifert, N., Sethi, K., Schmitz, A., Wu, H., Yeoh, A.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
The binding of zinc and copper ions to nerve growth factor is differentially affected by pH: implications for cerebral acidosis
Ross, Gregory M., Shamovsky, Igor L., Woo, Sang B., Post, Joan I., Vrkljan, Philip N., Lawrance, Gail, Solc, Mark, Dostaler, Suzanne M., Neet, Kenneth E., Riopelle, Richard J.
Published in Journal of neurochemistry (01.08.2001)
Published in Journal of neurochemistry (01.08.2001)
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Journal Article
A comparison of state-of-the-art NMOS and SiGe HBT devices for analog/mixed-signal/RF circuit applications
Kuhn, K., Basco, R., Becher, D., Hattendorf, M., Packan, P., Post, I., Vandervoorn, P., Young, I.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding
Reliability studies on a 45nm low power system-on-chip (SoC) dual gate oxide high-k / metal gate (DG HK+MG) technology
Prasad, C, Bai, P, Gannavaram, S, Hafez, W, Hicks, J, Jan, C, Lin, J, Jones, M, Komeyli, K, Kotlyar, R, Mistry, K, Post, I, Tsai, C
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Catecholaminergic Neuronal Degeneration in Rainbow Trout Assessed by Skin Color Change: A Model System for Identification of Environmental Risk Factors
Ryan, Roby W.J., Post, Joan I., Solc, Mark, Hodson, Peter V., Ross, Gregory M.
Published in Neurotoxicology (Park Forest South) (01.10.2002)
Published in Neurotoxicology (Park Forest South) (01.10.2002)
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Journal Article
Cochlear Implantation of Danish Prelingually Deaf Children
Tos, J. Hedegaard Jensen, G. Salomon, M. H. Jønsson, I. Post, J. C. Thomsen, M.
Published in Acta oto-laryngologica (2000)
Published in Acta oto-laryngologica (2000)
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Journal Article
Conference Proceeding
A 2.7-4.5 V single chip GSM transceiver RF integrated circuit
Stetzler, T.D., Post, I.G., Havens, J.H., Koyama, M.
Published in IEEE journal of solid-state circuits (01.12.1995)
Published in IEEE journal of solid-state circuits (01.12.1995)
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Journal Article
Self-heat reliability considerations on Intel's 22nm Tri-Gate technology
Prasad, C., Jiang, L., Singh, D., Agostinelli, M., Auth, C., Bai, P., Eiles, T., Hicks, J., Jan, C. H., Mistry, K., Natarajan, S., Niu, B., Packan, P., Pantuso, D., Post, I., Ramey, S., Schmitz, A., Sell, B., Suthram, S., Thomas, J., Tsai, C., Vandervoorn, P.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Bias temperature instability variation on SiON/Poly, HK/MG and trigate architectures
Prasad, C., Agostinelli, M., Hicks, J., Ramey, S., Auth, C., Mistry, K., Natarajan, S., Packan, P., Post, I., Bodapati, S., Giles, M., Gupta, S., Mudanai, S., Kuhn, K.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Continuity created by nurses in the perioperative dialogue - a literature review
Lindwall, Lillemor, Von Post, Iréne
Published in Scandinavian Journal of Caring Sciences (01.06.2009)
Published in Scandinavian Journal of Caring Sciences (01.06.2009)
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Journal Article
Book Review
The unexpected force of acute stroke leading to patients' sudden death as described by nurses
Rejnö, Åsa, Danielson, Ella, von Post, Iréne
Published in Scandinavian journal of caring sciences (01.03.2013)
Published in Scandinavian journal of caring sciences (01.03.2013)
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Journal Article
A 65nm CMOS SOC Technology Featuring Strained Silicon Transistors for RF Applications
Post, I., Akbar, M., Curello, G., Gannavaram, S., Hafez, W., Jalan, U., Komeyii, K., Lin, J., Lindert, N., Park, J., Rizk, J., Sacks, G., Tsai, C., Yeh, D., Bai, P., Jan, C.-H.
Published in 2006 International Electron Devices Meeting (2006)
Published in 2006 International Electron Devices Meeting (2006)
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Conference Proceeding