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Measurement and modelling of 1/f noise in 180 nm NMOS and PMOS devices
Mavredakis, N, Antonopoulos, A, Bucher, M
Published in 2010 5th European Conference on Circuits and Systems for Communications (01.11.2010)
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Published in 2010 5th European Conference on Circuits and Systems for Communications (01.11.2010)
Conference Proceeding
Discussion group (DG) summary: NBTI
Campbell, Jason
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
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Conference Proceeding
Warpage, stresses and KOZ of 3D TSV DRAM package during manufacturing processes
Huang, P. S., Tsai, M. Y., Huang, C. Y., Lin, P. C., Huang, Lawrence, Chang, Michael, Shih, Steven, Lin, J.P.
Published in 2012 14th International Conference on Electronic Materials and Packaging (01.12.2012)
Published in 2012 14th International Conference on Electronic Materials and Packaging (01.12.2012)
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Conference Proceeding
Carrier confinement in MOS-gated Ge/sub x/Si/sub 1-x//Si heterostructures
Garone, P.M., Venkataraman, V., Sturm, J.C.
Published in Technical digest - International Electron Devices Meeting (1990)
Published in Technical digest - International Electron Devices Meeting (1990)
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Conference Proceeding