Angle- and polarization resolved antireflection properties of black silicon prepared by electrochemical etching supported by external electric field
Müllerová, Jarmila, Scholtz, Ľubomír, Ďurišová, Jana, Pinčík, Emil, Solanská, Michaela, Pudiš, Dušan
Published in Applied surface science (15.12.2018)
Published in Applied surface science (15.12.2018)
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Journal Article
Optical properties of electrochemically etched N-type silicon wafers for solar cell applications
Králik, Martin, Goraus, Matej, Pinčík, Emil
Published in Journal of Electrical Engineering (01.12.2020)
Published in Journal of Electrical Engineering (01.12.2020)
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Journal Article
Multifractal analysis of textured silicon surfaces
Jurečka, Stanislav, Angermann, Heike, Kobayashi, Hikaru, Takahashi, Masao, Pinčík, Emil
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
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Journal Article
Conference Proceeding
Black silicon – correlation between microstructure and Raman scattering
Jurečka, Stanislav, Pinčík, Emil, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2019)
Published in Journal of Electrical Engineering (01.12.2019)
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Journal Article
About complex refractive index of black Si
Pinčík, Emil, Brunner, Robert, Kobayashi, Hikaru, Mikula, Milan
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
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Journal Article
Properties of HfO2/ultrathin SiO2/Si structures and their comparison with Si MOS structures passivated in KCN solution
Pinčík, Emil, Kobayashi, Hikaru, Matsumoto, Taketoshi, Takahashi, Masao, Mikula, Milan, Brunner, Róbert
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
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Journal Article
Conference Proceeding
Effect of etching time on structure of p-type porous silicon
Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Vojtek, Pavol, Gregus, Jan, Vavrinsky, Erik, Jergel, Matej, Pincik, Emil
Published in Applied surface science (15.12.2018)
Published in Applied surface science (15.12.2018)
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Journal Article
On KCN treatment effects on optical properties of Si-based bilayers
Müllerová, Jarmila, Pinčík, Emil, Králik, Martin, Holá, Michaela, Takahashi, Masao, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2019)
Published in Journal of Electrical Engineering (01.12.2019)
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Journal Article
Properties of charge states in MOS structure with ultrathin oxide layer
Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Matsumoto, Taketoshi, Pinčík, Emil
Published in Applied surface science (15.08.2012)
Published in Applied surface science (15.08.2012)
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Journal Article
Conference Proceeding
The effect of KCN passivation on IR spectra of a-Si based structures
Kopani, Martin, Mikula, Milan, Fujiwara, Naozumi, Takahashi, Masao, Pinčík, Emil
Published in Applied surface science (15.08.2012)
Published in Applied surface science (15.08.2012)
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Journal Article
Conference Proceeding
Effect of etching time in hydrofluoric acid on the structure and morphology of n-type porous silicon
Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Kovac, Jaroslav, Trnka, Michal, Gregus, Jan, Jerigova, Monika, Jergel, Matej, Vavrinsky, Erik, Bacova, Silvia, Zitto, Peter, Polak, Stefan, Pincik, Emil
Published in Applied surface science (01.12.2020)
Published in Applied surface science (01.12.2020)
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Journal Article
Temperature dependence of photoluminescence peaks of porous silicon structures
Brunner, Róbert, Pinčík, Emil, Kučera, Michal, Greguš, Ján, Vojtek, Pavel, Zábudlá, Zuzana
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
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Journal Article