Glyoxal as a Potential Source of Highly Viscous Aerosol Particles
Peters, Jan-Hendrik, Dette, Hans Peter, Koop, Thomas
Published in ACS earth and space chemistry (16.12.2021)
Published in ACS earth and space chemistry (16.12.2021)
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Journal Article
Field-Data based Lab Testing of a Wind-Energy Power Converter System: Insights into Cabinet and IGBT-Module Microclimates
Zorn, Christian, Peters, Jan-Hendrik, Hanf, Michael, Adler, Johannes, Holzke, Wilfried, Pelka, Karoline, Broer, Christian, Frohling, Soren, Kostka, Benedikt, Wenzel, Johannes, Mertens, Axel, Dehning, Kirsten, Zimmermann, Stefan, Fischer, Katharina, Kaminski, Nando
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
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Conference Proceeding
Verification of Hygrothermal Simulations Using Silicone Encapsulated Climate Sensors in Continuously Operated IGBT Power Modules
Frohling, Soren, Kostka, Benedikt, Wenzel, Johannes C., Fischer, Katharina, Peters, Jan-Hendrik, Hanf, Michael, Zorn, Christian, Dehning, Kirsten, Zimmermann, Stefan, Kaminski, Nando, Mertens, Axel
Published in 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) (22.05.2023)
Published in 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) (22.05.2023)
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Conference Proceeding
METHOD FOR PRODUCING A MASK FOR THE EXTREME ULTRAVIOLET WAVELENGTH RANGE MASK AND DEVICE
CAPELLI RENZO, BLUMRICH JORG FREDERIK, PETERS JAN HENDRIK, GARETTO ANTHONY
Year of Publication 11.05.2017
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Year of Publication 11.05.2017
Patent
Enabling future generation high-speed inspection through a massively parallel e-beam approach
Malloy, Matt, Bunday, Benjamin, Wurm, Stefan, Thiel, Brad, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
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Conference Proceeding
Method for localizing defects on substrates
Husemann, Christoph, Peters, Jan Hendrik, Blumrich, Jörg Frederik, Seidel, Dirk
Year of Publication 23.10.2018
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Year of Publication 23.10.2018
Patent