Electron-beam testing of VLSI circuits
Wolfgang, E., Lindner, R., Fazekas, P., Feuerbaum, H.-P.
Published in IEEE transactions on electron devices (01.04.1979)
Published in IEEE transactions on electron devices (01.04.1979)
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Journal Article
Electro-optical scanner having selectable scan pattern
CAMPANELLI; JOSEPH, KRICHEVER; MARK, GUREVICH; VLADIMIR, COURTNEY; LISA, FAZEKAS; PETER, KAHN; JOEL, METLITSKY; BORIS, SWARTZ; JEROME
Year of Publication 23.11.1999
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Year of Publication 23.11.1999
Patent
Analysis of channel estimation imperfections within the 3GPP LTE physical layer
Mraz, A., Fazekas, P.
Published in 2011 International Conference on the Network of the Future (01.11.2011)
Published in 2011 International Conference on the Network of the Future (01.11.2011)
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Conference Proceeding
Electron-beam testing of VLSI circuits
Wolfgang, E., Fazekas, P., Feuerbaum, H.-P., Lindner, R.
Published in IEEE journal of solid-state circuits (01.04.1979)
Published in IEEE journal of solid-state circuits (01.04.1979)
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Journal Article