Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering
Boscaro, A., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Backside spectroscopic photon emission microscopy using intensified silicon CCD
Glowacki, A., Boit, C., Perdu, P., Iwaki, Y.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies
Penzes, M., Dudit, S., Monsieur, F., Silvestri, L., Nallet, F., Lewis, D., Perdu, P.
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
High performance thermography with InGaAs photon counting camera
Bascoul, G., Perdu, P., Beguin, M., Lewis, D.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Conference Proceeding
Optimum Si thickness for backside detection of photon emission using Si-CCD
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Conference Proceeding
Frequency mapping in dynamic light emission with wavelet transform
Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Pattern image enhancement by extended depth of field
Chef, S., Billiot, B., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning
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Conference Proceeding
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
EL MOUKHTARI, I, POUGET, V, LARUE, C, DARRACQ, F, LEWIS, D, PERDU, P
Published in Microelectronics and reliability (01.11.2013)
Published in Microelectronics and reliability (01.11.2013)
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Journal Article
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package
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Conference Proceeding
A comprehensive study of the application of the EOP techniques on bipolar devices
Rebaï, M.M., Darracq, F., Guillet, J.-P., Bernou, E., Sanchez, K., Perdu, P., Lewis, D.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, A., Pouget, V., Darracq, F., Lewis, D., Fouillat, P., Perdu, P.
Published in IEEE transactions on nuclear science (01.08.2006)
Published in IEEE transactions on nuclear science (01.08.2006)
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Journal Article
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
Bascoul, G., Perdu, P., Benigni, A., Dudit, S., Celi, G., Lewis, D.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics
Molière, F., Foucher, B., Perdu, P., Bravaix, A.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Conference Proceeding
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications
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Conference Proceeding
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques
Bouya, M., Malbert, N., Labat, N., Carisetti, D., Perdu, P., Clément, J.C., Lambert, B., Bonnet, M.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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CADless laser assisted methodologies for failure analysis and device reliability
Deyine, A., Sanchez, K., Perdu, P., Battistella, F., Lewis, D.
Published in Microelectronics and reliability (01.11.2010)
Published in Microelectronics and reliability (01.11.2010)
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Journal Article
Conference Proceeding
Dynamic study of the thermal laser stimulation response on advanced technology structures
Reverdy, A., de la Bardonnie, M., Poirier, P., Murray, H., Perdu, P., Boukkali, A.
Published in Microelectronics and reliability (01.10.2008)
Published in Microelectronics and reliability (01.10.2008)
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Journal Article
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC
Bouya, M., Carisetti, D., Malbert, N., Labat, N., Perdu, P., Clément, J.C., Bonnet, M., Pataut, G.
Published in Microelectronics and reliability (01.09.2007)
Published in Microelectronics and reliability (01.09.2007)
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