Low-Resistance Integrated Toroidal Inductor for Power Management
Orlando, B., Hida, R., Cuchet, R., Audoin, M., Viala, B., Pellissier-Tanon, D., Gagnard, X., Ancey, P.
Published in IEEE transactions on magnetics (01.10.2006)
Published in IEEE transactions on magnetics (01.10.2006)
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Conference Proceeding
Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
Fenouillet-Beranger, C., Perreau, P., Benoist, T., Richier, C., Haendler, S., Pradelle, J., Bustos, J., Brun, P., Tosti, L., Weber, O., Andrieu, F., Orlando, B., Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gregoire, M., Ducote, J., Gouraud, P., Margain, A., Borowiak, C., Bianchini, R., Planes, N., Gourvest, E., Bourdelle, K.K., Nguyen, B.Y., Poiroux, T., Skotnicki, T., Faynot, O., Boeuf, F.
Published in Solid-state electronics (01.10.2013)
Published in Solid-state electronics (01.10.2013)
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Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances
Ben Akkez, Imed, Fenouillet-Beranger, Claire, Cros, Antoine, Perreau, Pierre, Haendler, Sébatien, Weber, Olivier, Andrieu, François, Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gouraud, P., Margain, A., Borowiak, C., Gourvest, E., Bourdelle, K.K., Nguyen, B.Y., Poiroux, T., Skotnicki, Thomas, Faynot, Olivier, Balestra, Francis, Ghibaudo, Gérard, Boeuf, Fréderic
Published in Solid-state electronics (01.12.2013)
Published in Solid-state electronics (01.12.2013)
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Conference Proceeding
Understanding Ge impact on VT and VFB in Si1−xGex/Si pMOSFETs
Soussou, A., Leroux, C., Rideau, D., Toffoli, A., Romano, G., Saxod, O., Bidal, G., Barge, D., Pellissier-Tanon, D., Abbate, F., Tavernier, C., Reimbold, G., Ghibaudo, G.
Published in Microelectronic engineering (01.09.2013)
Published in Microelectronic engineering (01.09.2013)
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Journal Article
Understanding Ge impact on VT and VFB in Si sub(1-x)Ge sub(x)/Si pMOSFETs
Soussou, A, Leroux, C, Rideau, D, Toffoli, A, Romano, G, Saxod, O, Bidal, G, Barge, D, Pellissier-Tanon, D, Abbate, F, Tavernier, C, Reimbold, G, Ghibaudo, G
Published in Microelectronic engineering (01.09.2013)
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Published in Microelectronic engineering (01.09.2013)
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Understanding Ge impact on VT and VFB in Si1-xGex/Si pMOSFETs: Insulating Films on Semiconductors 2013
SOUSSOU, A, LEROUX, C, TAVERNIER, C, REIMBOLD, G, GHIBAUDO, G, RIDEAU, D, TOFFOLI, A, ROMANO, G, SAXOD, O, BIDAL, G, BARGE, D, PELLISSIER-TANON, D, ABBATE, F
Published in Microelectronic engineering (2013)
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Published in Microelectronic engineering (2013)
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Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology: Selected extended papers from ULIS 2012 conference
FENOUILLET-BERANGER, C, PERREAU, P, ANDRIEU, F, ORLANDO, B, PELLISSIER-TANON, D, ABBATE, F, RICHARD, C, BENEYTON, R, GREGOIRE, M, DUCOTE, J, GOURAUD, P, MARGAIN, A, BENOIST, T, BOROWIAK, C, BIANCHINI, R, PLANES, N, GOURVEST, E, BOURDELLE, K. K, NGUYEN, B. Y, POIROUX, T, SKOTNICKI, T, FAYNOT, O, BOEUF, F, RICHIER, C, HAENDLER, S, PRADELLE, J, BUSTOS, J, BRUN, P, TOSTI, L, WEBER, O
Published in Solid-state electronics (2013)
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Published in Solid-state electronics (2013)
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Enhancement of devices performance of hybrid FDSOI/bulk technology by using UTBOX sSOI substrates
Fenouillet-Beranger, C., Perreau, P., Weber, O., Ben-Akkez, I., Cros, A., Bajolet, A., Haendler, S., Fonteneau, P., Gouraud, P., Richard, E., Abbate, F., Barge, D., Pellissier-Tanon, D., Dumont, B., Andrieu, F., Passieux, J., Bon, R., Barral, V., Golanski, D., Petit, D., Planes, N., Bonin, O., Schwarzenbach, W., Poiroux, T., Faynot, O., Haond, M., Boeuf, F.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
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Conference Proceeding
Impact of 45° rotated substrate on UTBOX FDSOI high-k metal gate technology
Ben Akkez, I., Fenouillet-Beranger, C., Cros, A., Perreau, P., Haendler, S., Weber, O., Andrieu, F., Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gouraud, P., Margain, A., Borowiak, C., Gourvest, E., Bourdelle, K. K., Nguyen, B. Y., Poiroux, T., Skotnicki, T., Faynot, O., Balestra, F., Ghibaudo, G., Boeuf, F.
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
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Conference Proceeding
MOS Capacitor Deep Trench Isolation for CMOS image sensors
Ahmed, N., Roy, F., Lu, G.-N, Mamdy, B., Carrere, J.-P, Tournier, A., Virollet, N., Perrot, C., Rivoire, M., Seignard, A., Pellissier-Tanon, D., Leverd, F., Orlando, B.
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
Fenouillet-Beranger, C., Perreau, P., Benoist, T., Richier, C., Haendler, S., Pradelle, J., Bustos, J., Brun, P., Tosti, L., Weber, O., Andrieu, F., Orlando, B., Pellissier-Tanon, D., Abbate, F., Pvichard, C., Beneyton, R., Gregoire, M., Ducote, J., Gouraud, P., Margain, A., Borowiak, C., Bianchini, R., Planes, N., Gourvest, E., Bourdelle, K. K., Nguyen, B. Y., Poiroux, T., Skotnicki, T., Faynot, O., Boeuf, F.
Published in 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2012)
Published in 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2012)
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Conference Proceeding
Impact of substrate orientation on Ultra Thin BOX Fully Depleted SOI electrical performances
Ben Akkez, I., Fenouillet-Beranger, C., Cros, A., Perreau, P., Haendler, S., Weber, O., Andrieu, F., Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gouraud, P., Margain, A., Borowiak, C., Gourvest, E., Bourdelle, K. K., Nguyen, B. Y., Poiroux, T., Skotnicki, T., Faynot, O., Balestra, F., Ghibaudo, G., Boeuf, F.
Published in 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2012)
Published in 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2012)
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Conference Proceeding