Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications
Kumar, B. Sampath, Ajay, Paul, Milova, Somayaji, Jhnanesh, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Journal Article
Drain-Extended FinFET With Embedded SCR (DeFinFET-SCR) for High-Voltage ESD Protection and Self-Protected Designs
Paul, Milova, Sampath Kumar, B., Karmel Nagothu, Kranthi, Singhal, Pulkit, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.12.2019)
Published in IEEE transactions on electron devices (01.12.2019)
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Journal Article
Challenges & Physical Insights Into the Design of Fin-Based SCRs and a Novel Fin-SCR for Efficient On-Chip ESD Protection
Paul, Milova, Sampath Kumar, B., Russ, Christian, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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Journal Article
Physics of Current Filamentation in ggNMOS Devices Under ESD Condition Revisited
Paul, Milova, Russ, Christian, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.07.2018)
Published in IEEE transactions on electron devices (01.07.2018)
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Journal Article
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?
Paul, Milova, Russ, Christian, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
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Conference Proceeding
Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs
M., Monishmurali, Paul, Milova, Shrivastava, Mayank
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
HIGH-VOLTAGE ELECTROSTATIC DISCHARGE DEVICES
GAUTHIER JR. ROBERT J, HWANG KYONG JIN, PAUL MILOVA, KARALKAR SAGAR P
Year of Publication 14.02.2023
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Year of Publication 14.02.2023
Patent
Design Optimization of MV-NMOS to Improve Holding Voltage of a 28nm CMOS Technology ESD Power Clamp
Karalkar, Sagar P, Ganesan, Vishal, Paul, Milova, Hwang, KyongJin, Gauthier, Robert
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Performance and reliability insights of drain extended FinFET devices for high voltage SoC applications
Kumar, B Sampath, Paul, Milova, Shrivastava, Mayank, Gossner, Harald
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
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Conference Proceeding
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability
Paul, Milova, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Symmetric bi-directional silicon-controlled rectifier for electrostatic discharge protection
Karalkar, Sagar Premnath, Paul, Milova, Mahajan, Prantik, Mitra, Souvick, Zeng, Jie, Ajay, Ajay
Year of Publication 30.07.2024
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Year of Publication 30.07.2024
Patent
Physical Insights into the ESD behavior of Drain Extended FinFETs
Sampath Kumar, B., Paul, Milova, Gossner, Harald, Shrivastava, Mayank
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
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Conference Proceeding
High-voltage electrostatic discharge devices
Paul, Milova, Gauthier, Jr., Robert J, Hwang, Kyong Jin, Karalkar, Sagar P
Year of Publication 07.05.2024
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Year of Publication 07.05.2024
Patent
High-voltage electrostatic discharge devices
Karalkar, Sagar Premnath, Paul, Milova, Gauthier, Jr., Robert J, Hwang, Kyong Jin
Year of Publication 26.03.2024
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Year of Publication 26.03.2024
Patent