The analysis of dark signals in the CMOS APS imagers from the characterization of test structures
Kwon, H.I., Kang, I.M., Park, B.-G., Lee, J.D., Park, S.S.
Published in IEEE transactions on electron devices (01.02.2004)
Published in IEEE transactions on electron devices (01.02.2004)
Get full text
Journal Article
A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure
Lee, Myoung-Sun, Joe, Sung-Min, Yun, Jang-Gn, Shin, Hyung-Cheol, Park, Byung-Gook, Park, Sang-Sik, Lee, Jong-Ho
Published in Journal of semiconductor technology and science (01.09.2012)
Published in Journal of semiconductor technology and science (01.09.2012)
Get full text
Journal Article
The effects of deuterium annealing on the reduction of dark currents in the CMOS APS
Hyuck In Kwon, Kwon, O.J., Hyungcheol Shin, Byung-Gook Park, Sang Sik Park, Jong Duk Lee
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
Get full text
Journal Article
A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure
Lee, Myoung-Sun, Joe, Sung-Min, Yun, Jang-Gn, Shin, Hyung-Cheol, Park, Byung-Gook, Park, Sang-Sik, Lee, Jong-Ho
Published in Journal of semiconductor technology and science (2012)
Get full text
Published in Journal of semiconductor technology and science (2012)
Journal Article
Carbon nanotubes growing on rapid thermal annealed Ni and their application to a triode-type field emission device
Get full text
Journal Article
Conference Proceeding
Transparent, Low-Power Pressure Sensor Matrix Based on Coplanar-Gate Graphene Transistors
Sun, Qijun, Kim, Do Hwan, Park, Sang Sik, Lee, Nae Yoon, Zhang, Yu, Lee, Jung Heon, Cho, Kilwon, Cho, Jeong Ho
Published in Advanced materials (Weinheim) (16.07.2014)
Published in Advanced materials (Weinheim) (16.07.2014)
Get full text
Journal Article