Isolation and characterization of cancer-associated fibroblasts in the tumor microenvironment of hepatocellular carcinoma
Mun, Kyoungdo, Han, Jiwon, Roh, Pureun, Park, Jonggeun, Kim, Gahee, Hur, Wonhee, Jang, Jeongwon, Choi, Jongyoung, Yoon, Seungkew, You, Youngkyoung, Choi, Hojoong, Sung, Pilsoo
Published in Journal of liver cancer (01.09.2023)
Published in Journal of liver cancer (01.09.2023)
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Journal Article
Isolation and characterization of cancer-associated fibroblasts in the tumor microenvironment of hepatocellular carcinoma
Mun, Kyoungdo, Han, Jiwon, Roh, Pureun, Park, Jonggeun, Kim, Gahee, Hur, Wonhee, Jang, Jeongwon, Choi, Jongyoung, Yoon, Seungkew, You, Youngkyoung, Choi, Hojoong, Sung, Pilsoo
Published in Journal of liver cancer (12.06.2023)
Published in Journal of liver cancer (12.06.2023)
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Journal Article
SYSTEM AND METHOD FOR PROVIDING HOLOPORTATION
HWANG YOUNGBAE, KIM MYEONG KYUN, KIM SUNGJEI, PARK JONGGEUN, KIM YORA
Year of Publication 22.06.2020
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Year of Publication 22.06.2020
Patent
3 SYSTEM AND METHOD FOR COMPRESSION AND DECOMPRESSION OF 3D MESH MODEL
HWANG YOUNGBAE, KIM MYEONG KYUN, KIM SUNGJEI, PARK JONGGEUN, KIM YORA
Year of Publication 08.06.2020
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Year of Publication 08.06.2020
Patent
New Method for Identifying Yield Impacting Polishing Induced Defects (PID) on Polished Silicon Substrates
Kim, KeunSu, Moon, Byeongsam, Suh, Hyo Sik, Kim, Jiae, Venkat, Sivakumar, Lee, Sanghyun, Shen, William, Shin, Yong, Park, Jonggeun, An, Jeonghoon, Seo, Scott, Ku, Jachun, Park, SungKi, Saito, Jason, Douglas, Carlotte
Published in ECS transactions (2009)
Published in ECS transactions (2009)
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Journal Article
Long-Term Evolution Vulnerability Focusing on System Information Block Messages
Kim, Minjae, Park, JongGeun, Moon, DaeSung, Jang, JongSoo, Kim, YoungSoo, Lee, JongHoon
Published in 2020 International Conference on Information and Communication Technology Convergence (ICTC) (21.10.2020)
Published in 2020 International Conference on Information and Communication Technology Convergence (ICTC) (21.10.2020)
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Conference Proceeding
New Yield-Impacting Polishing Induced Defects (PID) and A Method to Identify Them for Polished Si Substrates
Suh, Hyo Sik, Moon, Byeongsam, Kim, KeunSu, Kim, Jiae, Venkat, Sivakumar, Lee, Sanghyun, Shen, William, Shin, Yong, Park, Jonggeun, An, Jeonghoon, Seo, Scott, Park, SungKi
Published in Meeting abstracts (Electrochemical Society) (29.08.2008)
Published in Meeting abstracts (Electrochemical Society) (29.08.2008)
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Journal Article