Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs
Tsormpatzoglou, A., Dimitriadis, C.A., Clerc, R., Pananakakis, G., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.09.2008)
Published in IEEE transactions on electron devices (01.09.2008)
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Journal Article
A compact drain current model of short-channel cylindrical gate-all-around MOSFETs
Tsormpatzoglou, A, Tassis, D H, Dimitriadis, C A, Ghibaudo, G, Pananakakis, G, Clerc, R
Published in Semiconductor science and technology (01.07.2009)
Published in Semiconductor science and technology (01.07.2009)
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Journal Article
Experimental and theoretical investigation of nano-crystal and nitride-trap memory devices
De Salvo, B., Ghibaudo, G., Pananakakis, G., Masson, P., Baron, T., Buffet, N., Fernandes, A., Guillaumot, B.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
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Journal Article
Analytical threshold voltage model for lightly doped short-channel tri-gate MOSFETs
Tsormpatzoglou, A., Tassis, D.H., Dimitriadis, C.A., Ghibaudo, G., Collaert, N., Pananakakis, G.
Published in Solid-state electronics (01.03.2011)
Published in Solid-state electronics (01.03.2011)
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Reliability of charge trapping memories with high- k control dielectrics (Invited Paper)
Molas, G., Bocquet, M., Vianello, E., Perniola, L., Grampeix, H., Colonna, J.P., Masarotto, L., Martin, F., Brianceau, P., Gély, M., Bongiorno, C., Lombardo, S., Pananakakis, G., Ghibaudo, G., De Salvo, B.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Conference Proceeding
Source/drain optimization of underlapped lightly doped nanoscale double-gate MOSFETs
Tassis, D.H., Tsormpatzoglou, A., Dimitriadis, C.A., Ghibaudo, G., Pananakakis, G., Collaert, N.
Published in Microelectronic engineering (01.11.2010)
Published in Microelectronic engineering (01.11.2010)
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Journal Article
Ionizing radiation induced leakage current on ultra-thin gate oxides
Scarpa, A., Paccagnella, A., Montera, F., Ghibaudo, G., Pananakakis, G., Ghidini, G., Fuochi, P.G.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Wear-out, breakdown occurrence and failure detection in 18–25 Å ultrathin oxides
Monsieur, F., Vincent, E., Pananakakis, G., Ghibaudo, G.
Published in Microelectronics and reliability (01.07.2001)
Published in Microelectronics and reliability (01.07.2001)
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Journal Article
Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories
BOCQUET, M, MOLAS, G, TOFFOLI, A, DELEONIBUS, S, GHIBAUDO, G, PANANAKAKIS, G, DE SALVO, B, PERNIOLA, L, GARROS, X, BUCKLEY, J, GELY, M, COLONNA, J. P, GRAMPEIX, H, MARTIN, F, VIDAL, V
Published in Solid-state electronics (01.07.2009)
Published in Solid-state electronics (01.07.2009)
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Journal Article
Conventional Technological Boosters for Injection Velocity in Ultrathin-Body MOSFETs
Ferrier, M., Clerc, R., Lucci, L., Rafhay, Q., Pananakakis, G., Ghibaudo, G., Boeuf, F., Skotnicki, T.
Published in IEEE transactions on nanotechnology (01.11.2007)
Published in IEEE transactions on nanotechnology (01.11.2007)
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Journal Article
Evaluation of HfAlO high- k materials for control dielectric applications in non-volatile memories
Molas, G., Bocquet, M., Buckley, J., Grampeix, H., Gély, M., Colonna, J.P., Martin, F., Brianceau, P., Vidal, V., Bongiorno, C., Lombardo, S., Pananakakis, G., Ghibaudo, G., De Salvo, B., Deleonibus, S.
Published in Microelectronic engineering (01.12.2008)
Published in Microelectronic engineering (01.12.2008)
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Conference Proceeding
A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment
Monsieur, F., Vincent, E., Roy, D., Bruyere, S., Vildeuil, J.C., Pananakakis, G., Ghibaudo, G.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
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Conference Proceeding
Low-Frequency Series-Resistance Analytical Modeling of Three-Dimensional Metal-Insulator-Metal Capacitors
Bajolet, A., Clerc, R., Pananakakis, G., Tsamados, D., Picollet, E., Segura, N., Giraudin, J.-C., Delpech, P., Montes, L., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.04.2007)
Published in IEEE transactions on electron devices (01.04.2007)
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Journal Article
Experimental and theoretical investigation of nonvolatile memory data-retention
De Salvo, B., Ghibaudo, G., Pananakakis, G., Reimbold, G., Mondond, F., Guillaumot, B., Candelier, P.
Published in IEEE transactions on electron devices (01.07.1999)
Published in IEEE transactions on electron devices (01.07.1999)
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Journal Article
Carbon-doped Ge2Sb2Te5 phase-change memory devices featuring reduced RESET current and power consumption
Hubert, Q., Jahan, C., Toffoli, A., Navarro, G., Chandrashekar, S., Noe, P., Sousa, V., Perniola, L., Nodin, J.-F., Persico, A., Maitrejean, S., Roule, A., Henaff, E., Tessaire, M., Zuliani, P., Annunziata, R., Reimbold, G., Pananakakis, G., De Salvo, B.
Published in 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2012)
Published in 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2012)
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Conference Proceeding