Exposure to organophosphate ester flame retardants and plasticizers during pregnancy: Thyroid endocrine disruption and mediation role of oxidative stress
Yao, Yiming, Li, Mengqi, Pan, Liyang, Duan, Yishuang, Duan, Xiaoyu, Li, Yongcheng, Sun, Hongwen
Published in Environment international (01.01.2021)
Published in Environment international (01.01.2021)
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Journal Article
A low-power vertical dual-gate neurotransistor with short-term memory for high energy-efficient neuromorphic computing
Xu, Han, Shang, Dashan, Luo, Qing, An, Junjie, Li, Yue, Wu, Shuyu, Yao, Zhihong, Zhang, Woyu, Xu, Xiaoxin, Dou, Chunmeng, Jiang, Hao, Pan, Liyang, Zhang, Xumeng, Wang, Ming, Wang, Zhongrui, Tang, Jianshi, Liu, Qi, Liu, Ming
Published in Nature communications (11.10.2023)
Published in Nature communications (11.10.2023)
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Journal Article
Silicon Diode Uncooled FPA With Three-Dimensional Integrated CMOS Readout Circuits
Xue, Xingjun, Xiong, Hao, Song, Zhen, Du, Yuxin, Wu, Dong, Pan, Liyang, Wang, Zheyao
Published in IEEE sensors journal (15.01.2019)
Published in IEEE sensors journal (15.01.2019)
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Journal Article
Multifocal Mycobacterium kansasii osteomyelitis in a patient on ruxolitinib
Pan, Liyang, Lever, Elliott, Ma, Jianfei, Beynon, Huw, Brown, Michael, Manson, Jessica
Published in Clinical infection in practice (01.01.2022)
Published in Clinical infection in practice (01.01.2022)
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Journal Article
A Fast Application-Based Supply Voltage Optimization Method for Dual Voltage FPGA
Zhu, Jianfeng, Pan, Liyang, Yan, Yaru, Wu, Dong, He, Hu
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2014)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2014)
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Journal Article
TID Radiation Response of 3-D Vertical GAA SONOS Memory Cells
Fengying Qiao, Liyang Pan, Blomme, Pieter, Arreghini, Antonio, Lifang Liu, Van den bosch, Geert, Van Houdt, Jan, Jun Xu
Published in IEEE transactions on nuclear science (01.04.2014)
Published in IEEE transactions on nuclear science (01.04.2014)
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Journal Article
Thermal and Electrical Properties of BCB-Liner Through-Silicon Vias
Huang, Cui, Pan, Liyang, Liu, Ran, Wang, Zheyao
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.12.2014)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.12.2014)
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Journal Article
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Liu, Lifang, Arreghini, Antonio, Van den bosch, Geert, Pan, Liyang, Van Houdt, Jan
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
LSB page refresh based retention error recovery scheme for MLC NAND Flash
Ma, Haozhi, Liu, Lifang, Pan, Liyang, Xu, Jun
Published in Science China. Information sciences (01.04.2016)
Published in Science China. Information sciences (01.04.2016)
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Journal Article
Reliability Comparison of ISSG Oxide and HTO as Tunnel Dielectric in 3-D-SONOS Applications
Qiao, Fengying, Arreghini, Antonio, Blomme, Pieter, Date, Lucien, Van den Bosch, Geert, Pan, Liyang, Xu, Jun, Van Houdt, Jan
Published in IEEE electron device letters (01.05.2013)
Published in IEEE electron device letters (01.05.2013)
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Journal Article
Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology
Qiao, FengYing, Pan, LiYang, Yu, Xiao, Ma, HaoZhi, Wu, Dong, Xu, Jun
Published in Science China. Information sciences (01.06.2014)
Published in Science China. Information sciences (01.06.2014)
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Journal Article
Fabrication of ultra-thin silicon chips using thermally decomposable temporary bonding adhesive
Xingjun Xue, Shujie Yang, Dong Wu, Liyang Pan, Zheyao Wang
Published in 2016 IEEE SENSORS (01.10.2016)
Published in 2016 IEEE SENSORS (01.10.2016)
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Conference Proceeding
Data pre-emphasis based retention reliability enhance scheme for MLC NAND Flash memories
Ma Haozhi, Gao Zhongyi, Pan Liyang, Xu Jun
Published in 2015 IEEE 11th International Conference on ASIC (ASICON) (01.11.2015)
Published in 2015 IEEE 11th International Conference on ASIC (ASICON) (01.11.2015)
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Conference Proceeding
A 1G-cell floating-gate NOR flash memory in 65 nm technology with 100 ns random access time
Liu, LiFang, Wu, Dong, Liu, XueMei, Huo, ZongLiang, Liu, Ming, Pan, LiYang
Published in Science China. Information sciences (01.04.2015)
Published in Science China. Information sciences (01.04.2015)
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Journal Article
A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnect
Jianfeng, Zhu, Hu, He, Dong, Wu, Liyang, Pan
Published in Journal of electronic testing (01.10.2011)
Published in Journal of electronic testing (01.10.2011)
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Journal Article