Formation of octahedral corrosion products in Sn–Ag flip chip solder bump
Kang, Hanbyul, Lee, Miji, Sun, Dongyoon, Pae, Sangwoo, Park, Jongwoo
Published in Scripta materialia (01.11.2015)
Published in Scripta materialia (01.11.2015)
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Journal Article
Investigation of asymmetric degradation in electrical properties of a-InGaZnO thin-film transistor arrays as a function of channel width-to-length aspect ratio
Agrawal, Khushabu, Patil, Vilas, Chavan, G. T., Yoon, Geonju, Kim, Jaemin, Park, Jinsu, Pae, Sangwoo, Kim, JinSeok, Cho, Eun-Chel, Yi, Junsin
Published in Journal of materials science. Materials in electronics (01.06.2020)
Published in Journal of materials science. Materials in electronics (01.06.2020)
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Journal Article
Hot carrier reliability characterization in consideration of self-heating in FinFET technology
Minjung Jin, Changze Liu, Jinju Kim, Jungin Kim, Seungjin Choo, Yoohwan Kim, Hyewon Shim, Lijie Zhang, Kab-jin Nam, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Investigation of logic circuit soft error rate (SER) in 14nm FinFET technology
Uemura, Taiki, Soonyoung Lee, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Investigation of logic soft error and scaling effect in 10 nm FinFET technology
Uemura, Taiki, Soonyoung Lee, GunRae Kim, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Investigation of HCI effects in FinFET based ring oscillator circuits and IP blocks
Yoohwan Kim, Hyewon Shim, Minjung Jin, Jongsun Bae, Changze Liu, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Extraction of Effective Mobility from nMOSFETs With Leaky Gate Dielectric Using Time Domain Reflectometry
Yonghun Kim, Young Gon Lee, Ukjin Jung, Jin Ju Kim, Minhyeok Choe, Kyong Taek Lee, Sangwoo Pae, Jongwoo Park, Byoung Hun Lee
Published in IEEE transactions on electron devices (01.04.2015)
Published in IEEE transactions on electron devices (01.04.2015)
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Journal Article
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL
Changze Liu, Hyun-Chul Sagong, Hyejin Kim, Seungjin Choo, Hyunwoo Lee, Yoohwan Kim, Hyunjin Kim, Bisung Jo, Minjung Jin, Jinjoo Kim, Sangsu Ha, Sangwoo Pae, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Soft error rate analysis for incident angle and N-well structure dependencies using small-sized alpha source in 10nm FinFET technology
Soonyoung Lee, Uemura, Taiki, Monga, Udit, Jae Hee Choi, GunRae Kim, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
New insights into 10nm FinFET BTI and its variation considering the local layout effects
Changze Liu, Minjung Jin, Uemura, Taiki, Jinju Kim, Jungin Kim, Ukjin Jung, Hyun Chul Sagong, Gunrae Kim, Junekyun Park, Sangchul Shin, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Mismatch circuit aging modeling and simulations for robust product design and pre-/post-silicon verification
Hyewon Shim, Yoohwan Kim, Jongwook Jeon, Yongsang Cho, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
New observations on the random telegraph noise induced Vth variation in nano-scale MOSFETs
Changze Liu, Kyong Taek Lee, Hyunwoo Lee, Yoohwan Kim, Sangwoo Pae, Jongwoo Park
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
SRAM stability design comprehending 14nm FinFET reliability
Choelhwyi Bae, Sangwoo Pae, Cheong-sik Yu, Kangjung Kim, Yongshik Kim, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Reliability characterizations of display driver IC on High-k/ metal-gate technology
Donghoon Kim, Jungdong Kim, Kidan Bae, Hyejin Kim, Lira Hwang, Sangchul Shin, Hyung-Nyung Park, In-Taek Ku, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Frequency and recovery effects in high-κ BTI degradation
Ramey, S., Prasad, C., Agostinelli, M., Sangwoo Pae, Walstra, S., Gupta, S., Hicks, J.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Scenario-based set-level HTOL test (ASH III) for product quality and reliability qualifications on high-speed APs
Jongwoo Park, Jeonghoon Kim, Minhyeok Choe, Hyewon Shim, Wooyeon Kim, Sangmin Park, Sangchul Shin, Yunwhan Kim, Jiheon Jeong, Hyunjo Shin, Haebum Lee, Sangwoo Pae
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
CPI reliability and EMI benefit for MIM CAP embedded C4 package
Hyunsuk Chun, In Hak Baick, Sang-Su Ha, Eunmi Kwon, Seungbae Lee, Seil Kim, Sangwoo Pae, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL
Jungdong Kim, Donghun Kim, Minhyeok Choe, Kidan Bae, Sangchul Shin, Sangwoo Pae, Jongwoo Park
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Effects of N-Rich TiN Capping Layer on Reliability in Gate-Last High-k/Metal Gate MOSFETs
Bae, Kidan, Lee, Kyung Taek, Sagong, Hyun Chul, Choe, Minhyeok, Lee, Hyunwoo, Kim, Sungeun, Kim, Kwang-Soo, Park, Junekyun, Pae, Sangwoo, Park, Jongwoo
Published in ECS transactions (31.08.2013)
Published in ECS transactions (31.08.2013)
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Journal Article