Misfortune, challenge, and success: defects in processed semiconductor devices
Cerva, H., Engelhardt, M., Hierlemann, M., Pölzl, M., Thenikl, T.
Published in Physica. B, Condensed matter (01.12.2001)
Published in Physica. B, Condensed matter (01.12.2001)
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Journal Article
95% DC-DC conversion efficiency by novel trench power MOSFET with dual channel structure to cut body diode losses
Haberlen, O., Polzl, M., Schoiswohl, J., Rosch, M., Leomant, S., Nobauer, G., Rieger, W.
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
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Conference Proceeding
Misfortune, challenge, and success: defects in processed semiconductor devices
CERVA, H, ENGELHARDT, M, HIERLEMANN, M, PÖLZL, M, THENIKL, T
Published in Physica. B, Condensed matter (2001)
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Published in Physica. B, Condensed matter (2001)
Conference Proceeding
MELAS Syndrome and Kidney Disease Without Fanconi Syndrome or Proteinuria: A Case Report
Rudnicki, Michael, MD, Mayr, Johannes A., PhD, Zschocke, Johannes, MD, Antretter, Herwig, MD, Regele, Heinz, MD, Feichtinger, René G., PhD, Windpessl, Martin, MD, Mayer, Gert, MD, Pölzl, Gerhard, MD
Published in American journal of kidney diseases (01.12.2016)
Published in American journal of kidney diseases (01.12.2016)
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Journal Article
Reliability issues of ultra-thick gate oxides
Schwalke, U., Polzl, M., Sekinger, T., Kerber, M.
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
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Conference Proceeding
Ultra-thick gate oxides: charge generation and its impact on reliability
Schwalke, Udo, Pölzl, Martin, Sekinger, Thomas, Kerber, Martin
Published in Microelectronics and reliability (01.07.2001)
Published in Microelectronics and reliability (01.07.2001)
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Journal Article