by Taha, M. A., Oumar, D. A., Abderahim, A., Capraro, S., Pietroy, D., Chatelon, J. P., Rousseau, J. J.
Published in IEEE transactions on magnetics (01.12.2018)

by Boukhari, M. I., Oumar, D. A., Capraro, S., Pietroy, D., Chatelon, J. P., Rousseau, J. J.
Published in Journal of electronic testing (01.06.2021)

by Oumar, D. A., Boukhari, M. I., Capraro, S., Piétroy, D., Chatelon, J. P., Rousseau, J. J.
Published in Analog integrated circuits and signal processing (01.09.2020)

by Oumar, D. A., Boukhari, M. I., Taha, M. A., Capraro, S., Piétroy, D., Chatelon, J. P., Rousseau, J. J.
Published in Journal of electronic testing (01.04.2019)

by Boukhari, M.I., Oumar, D.A., Capraro, S., Pietroy, D., Chatelon, J.P, Rousseau, J.J
Published in 2022 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) (11.07.2022)

by Oumar, D.A., Boukhari, M.I., Capraro, S., Pietroy, D., Chatelon, J.P., Rousseau, J.J.
Published in 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) (01.06.2020)

by Mahamat, I Boukhari, Oumar, D.A., Malloum, S., Pietroy, D., Capraro, S., Chatelon, J. P., Rousseau, J. J.
Published in 2018 IEEE International Conference on Industrial Technology (ICIT) (01.02.2018)

by Oumar, D. A., Boukhari, M. I., Taha, M. A., Capraro, S., Pietroy, D., Chatelon, J. P., Rousseau, J. J.
Published in 2019 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) (01.05.2019)

by Oumar, D.A., Boukhari, M.I., Capraro, S., Girard, S., Pietroy, D., Chatelon, J.P., Rousseau, J.J., Paillet, P., Trinczek, M.
Published in 2019 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) (01.05.2019)