Dual Gate oxide reliability improved by Spacer and Salicide process optimisation
Richou, G., Ottenwaelder, D., Baltzinger, J.L., Delahaye, B., Domart, F., Soudry, A., Coudray, A., Langlois, J.F., Liebault, J., Donnard, D., Garroux, D., Fraquet, P., Nogueira, F., Laporte, N., Lefevre, H., Brun, J.P.
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
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Conference Proceeding
Emission dynamics of dot and wire DFB lasers
Jian Wang, Griesinger, U.A., Geiger, M., Ottenwaelder, D., Scholz, F., Schweizer, H.
Published in IEEE photonics technology letters (01.12.1996)
Published in IEEE photonics technology letters (01.12.1996)
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Journal Article