by Otte, Rik J., Agterberg, Martijn J. H., Van Wanrooij, Marc M., Snik, Ad F. M., Van Opstal, A. John
Published in Journal of the Association for Research in Otolaryngology (01.04.2013)

by Otte, Rik J., Fonville, Rob F., Knotter, Martin D.
Published in Microelectronics and reliability (01.09.2017)

by van der Wel, Paul J., Otte, Rik, Roberts, Harry, de Bruijn, Frank, van Zuijlen, Albert, Merkus, Ben
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by Lan, Guoyu, Otte, Rik, Goumans, Leon, Hsu, Andy, Roberts, Harry, Kung, Terry
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)

by Gandhi Tejinder
Published in Microelectronics Failure Analysis Desk Reference (2019)

by Shih Chia Lai, Sharma, Pradeep, Otte, Rik, Jung Hao Kung, Yao-han Wang, Chen, Sharon
Published in 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.06.2015)