A 65 nm test structure for SRAM device variability and NBTI statistics
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Published in Solid-state electronics (01.07.2009)
Published in Solid-state electronics (01.07.2009)
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Conference Proceeding
Analysis of Read Current and Write Trip Voltage Variability From a 1-MB SRAM Test Structure
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Published in IEEE transactions on semiconductor manufacturing (01.11.2008)
Published in IEEE transactions on semiconductor manufacturing (01.11.2008)
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Conference Proceeding
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Year of Publication 31.07.2024
Patent
A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors
Fischer, T., Amirante, E., Hofmann, K., Ostermayr, M., Huber, P., Schmitt-Landsiedel, D.
Published in ESSDERC 2008 - 38th European Solid-State Device Research Conference (01.09.2008)
Published in ESSDERC 2008 - 38th European Solid-State Device Research Conference (01.09.2008)
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Conference Proceeding
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Year of Publication 15.06.2023
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Year of Publication 14.06.2023
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Year of Publication 25.05.2023
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Year of Publication 05.04.2023
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Year of Publication 30.03.2023
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Semiconductor Dies and Devices with a Coil for Inductive Coupling
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Year of Publication 30.03.2023
Patent
SEMICONDUCTOR DIES AND DEVICES WITH COILS FOR INDUCTIVE COUPLING
ASSENMACHER, Joachim, LUTZ, Walther, SEIDEMANN, Georg, BAUMGARTNER, Peter, OSTERMAYR, Martin
Year of Publication 30.03.2023
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Year of Publication 30.03.2023
Patent
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ASSENMACHER, Joachim, LUTZ, Walther, SEIDEMANN, Georg, OSTERMAYR, Martin
Year of Publication 30.03.2023
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Year of Publication 30.03.2023
Patent
SEMICONDUCTOR DIES AND DEVICES WITH A COIL FOR INDUCTIVE COUPLING
ASSENMACHER, Joachim, LUTZ, Walther, SEIDEMANN, Georg, OSTERMAYR, Martin
Year of Publication 29.03.2023
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Year of Publication 29.03.2023
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