Bright Singularities: Polarimetric Calibration of Spaceborne PolSAR Systems
Cloude, S. R., Ossikovski, R., Garcia-Caurel, E.
Published in IEEE geoscience and remote sensing letters (01.03.2021)
Published in IEEE geoscience and remote sensing letters (01.03.2021)
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Journal Article
Structural circular birefringence and dichroism quantified by differential decomposition of spectroscopic transmission Mueller matrices from Cetonia aurata
Arwin, H, Mendoza-Galván, A, Magnusson, R, Andersson, A, Landin, J, Järrendahl, K, Garcia-Caurel, E, Ossikovski, R
Published in Optics letters (15.07.2016)
Published in Optics letters (15.07.2016)
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Journal Article
Sum decomposition of Mueller-matrix images and spectra of beetle cuticles
Arwin, H, Magnusson, R, Garcia-Caurel, E, Fallet, C, Järrendahl, K, Foldyna, M, De Martino, A, Ossikovski, R
Published in Optics express (09.02.2015)
Published in Optics express (09.02.2015)
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Journal Article
Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices
Foldyna, M, Garcia-Caurel, E, Ossikovski, R, De Martino, A, Gil, J J
Published in Optics express (20.07.2009)
Published in Optics express (20.07.2009)
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Journal Article
Depolarization effects in tip-enhanced Raman spectroscopy
Merlen, A., Valmalette, J. C., Gucciardi, P. G., Lamy de la Chapelle, M., Frigout, A., Ossikovski, R.
Published in Journal of Raman spectroscopy (01.10.2009)
Published in Journal of Raman spectroscopy (01.10.2009)
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Journal Article
Depolarizing Mueller matrices: how to decompose them?
Ossikovski, R., Anastasiadou, M., Ben Hatit, S., Garcia-Caurel, E., De Martino, A.
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
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Journal Article
Conference Proceeding
Polarized Raman spectroscopy analysis of SiHX bonds in nanocrystalline silicon thin films
Chaigneau, M., Johnson, E.V., Kroely, L., Roca i Cabarrocas, P., Ossikovski, R.
Published in Thin solid films (30.06.2013)
Published in Thin solid films (30.06.2013)
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Journal Article
Polarimetric characterization of optically anisotropic flexible substrates
Stchakovsky, M., Caillaud, C., Foldyna, M., Ossikovski, R., Garcia-Caurel, E.
Published in Thin solid films (15.02.2008)
Published in Thin solid films (15.02.2008)
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Journal Article
Conference Proceeding
Null ellipsometer with phase modulation
Postava, K, Maziewski, A, Yamaguchi, T, Ossikovski, R, Visnovsky, S, Pistora, J
Published in Optics express (29.11.2004)
Published in Optics express (29.11.2004)
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Journal Article
Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry
Foldyna, M., De Martino, A., Garcia-Caurel, E., Ossikovski, R., Bertin, F., Hazart, J., Postava, K., Drevillon, B.
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
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Journal Article
Conference Proceeding