Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels
Rizzolo, Serena, Goiffon, Vincent, Corbiere, Franck, Molina, Romain, Chabane, Aziouz, Girard, Sylvain, Paillet, Philippe, Magnan, Pierre, Boukenter, Aziz, Allanche, Timothe, Muller, Cyprien, Monsanglant-Louvet, Celine, Osmond, Melanie, Desjonqueres, Hortense, Mace, Jean-Reynald, Burnichon, Pierre, Baudu, Jean-Pierre, Plumeri, Stephane
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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