Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses
Ortolino, D., Kita, J., Beart, K., Wurm, R., Kleinewig, S., Pletsch, A., Moos, R.
Published in Microelectronics and reliability (01.01.2016)
Published in Microelectronics and reliability (01.01.2016)
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