Response of as grown dislocation structure to temperature and stress treatment in multi-crystalline silicon
Reimann, C., Friedrich, J., Meissner, E., Oriwol, D., Sylla, L.
Published in Acta materialia (01.07.2015)
Published in Acta materialia (01.07.2015)
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Journal Article
Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography
Oriwol, D., Carl, E.-R., Danilewsky, A.N., Sylla, L., Seifert, W., Kittler, M., Leipner, H.S.
Published in Acta materialia (01.10.2013)
Published in Acta materialia (01.10.2013)
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Numerical simulation of stresses and dislocations in quasi-mono silicon
Dadzis, K., Behnken, H., Bähr, T., Oriwol, D., Sylla, L., Richter, T.
Published in Journal of crystal growth (15.09.2016)
Published in Journal of crystal growth (15.09.2016)
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