Modeling of 2D bias control in overlap region of high-voltage MOSFETs for accurate device/circuit performance prediction
Tanaka, A, Oritsuki, Y, Kikuchihara, H, Miyake, M, Mattausch, H J, Miura-Mattausch, M, Liu, Y, Green, K
Published in 2010 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2010)
Published in 2010 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2010)
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Conference Proceeding
Effect of Impact-Ionization-Generated Holes on the Breakdown Mechanism in LDMOS Devices
Sakuda, T., Sadachika, N., Oritsuki, Y., Yokomichi, M., Miyake, M., Kajiwara, T., Kikuchihara, H., Feldmann, U., Mattausch, H.J., Miura-Mattausch, M.
Published in 2009 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2009)
Published in 2009 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2009)
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Conference Proceeding