by Ceric, H., Zahedmanesh, H., Croes, K., Lacerda de Orio, R., Selberherr, S.
Published in Journal of applied physics (14.03.2023)

by de Orio, R.L., Ceric, H., Selberherr, S.
Published in Microelectronics and reliability (01.06.2010)

by de Orio, R.L., Ceric, H., Selberherr, S.
Published in Microelectronics and reliability (01.09.2012)

by de Orio, R. L., Ender, J., Fiorentini, S., Goes, W., Selberherr, S., Sverdlov, V.
Published in IEEE journal of the Electron Devices Society (2021)

by Fiorentini, S., de Orio, R. L., Selberherr, S., Ender, J., Goes, W., Sverdlov, V.
Published in IEEE journal of the Electron Devices Society (2020)

by Baer, E., Evanschitzky, P., Lorenz, J., Roger, F., Minixhofer, R., Filipovic, L., de Orio, R.L., Selberherr, S.
Published in Microelectronic engineering (02.04.2015)

by de Orio, R.L., Makarov, A., Goes, W., Ender, J., Fiorentini, S., Sverdlov, V.
Published in Physica. B, Condensed matter (01.02.2020)

by Tyaginov, S., Starkov, I., Enichlmair, H., Jungemann, Ch, Park, J.M., Seebacher, E., Orio, R., Ceric, H., Grasser, T.
Published in Microelectronics and reliability (01.09.2011)

by Ceric, H., de Orio, R. L., Selberherr, S.
Published in 2022 IEEE International Interconnect Technology Conference (IITC) (27.06.2022)

by Ceric, H, de Orio, R L, Selberherr, S
Published in 2010 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2010)

by Bendra, M., Fiorentini, S., Ender, J., de Orio, R. L., Hadamek, T., Loch, W. J., Jorstad, N. P., Selberherr, S., Goes, W., Sverdlov, V.
Published in 2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO) (23.05.2022)

by Ceric, H., de Orio, R.L., Selberherr, S.
Published in Microelectronics and reliability (01.08.2023)

by Ceric, H., de Orio, R.L., Selberherr, S.
Published in Solid-state electronics (01.02.2023)

by Fiorentini, S., Ender, J., Selberherr, S., de Orio, R.L., Goes, W., Sverdlov, V.
Published in Solid-state electronics (01.12.2021)

by Fiorentini, S., Ender, J., Selberherr, S., de Orio, R.L., Goes, W., Sverdlov, V.
Published in Solid-state electronics (01.01.2023)

by de Orio, R.L., Ender, J., Fiorentini, S., Goes, W., Selberherr, S., Sverdlov, V.
Published in Solid-state electronics (01.11.2021)

by Ender, J., de Orio, R.L., Fiorentini, S., Selberherr, S., Goes, W., Sverdlov, V.
Published in Microelectronics and reliability (01.11.2021)

by Hadámek, T., Fiorentini, S., Bendra, M., Ender, J., de Orio, R.L., Goes, W., Selberherr, S., Sverdlov, V.
Published in Solid-state electronics (01.07.2022)

by Ceric, H., Selberherr, S., Zahedmanesh, H., de Orio, R. L., Croes, K.
Published in ECS journal of solid state science and technology (01.03.2021)

by Nunes, R.O., Ramirez, J.L., de Orio, R.L.
Published in Microelectronics and reliability (01.11.2020)