Quantitative Study of Electron Radiation Damage by in Situ Observation of the Phase Transformation from CaCO3 to CaO as a function of the accelerating voltage (20-300 kV)
Golla-Schindler, U., Schweigert, W., Benner, G., Orchowski, A., Kaiser, U.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Critical issues in the focused ion beam patterning of nanometric hole matrixes on GaAs based semiconducting devices
Catalano, M, Taurino, A, Lomascolo, M, Schertel, A, Orchowski, A
Published in Nanotechnology (28.03.2006)
Published in Nanotechnology (28.03.2006)
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Journal Article
Aberration-Correction in a Monochromated and Energy Filtered Environment
Bell, DC, Meyer, S, Orchowski, A, Tayebati, P, Benner, G
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
Focused Ion Beam Preparation Techniques for EFTEM Analysis
Gnauck, P., Zeile, U., Benner, G., Orchowski, A., Rau, W-D.
Published in Microscopy and microanalysis (01.08.2003)
Published in Microscopy and microanalysis (01.08.2003)
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Journal Article
Design and First Results of SESAM
Benner, G., Essers, E., Orchowski, A., Rau, W.-D.
Published in Microscopy and microanalysis (01.08.2003)
Published in Microscopy and microanalysis (01.08.2003)
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Journal Article
Progress on the realization of the electron column modules for SCALPEL high-throughput/alpha electron projection lithography tools
Stenkamp, D., Kienzle, O., Orchowski, A., Rau, W.D., Weickenmeier, A., Benner, G., Wetzke, M., Waskiewicz, W., Katsap, V., Zhu, X., Liu, H., Munro, E., Rouse, J.A.
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Journal Article
Conference Proceeding
Results on 20kV Spectroscopy with Monochromation and In-Column Filter
Pokrant, S, Orchowski, A, Benner, G, Cheynet, M, Kaiser, U
Published in Microscopy and microanalysis (01.07.2011)
Published in Microscopy and microanalysis (01.07.2011)
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Journal Article
Sub-[Angstrom]ngstrom and sub-eV resolution with the analytical SATEM
Benner, G, Matijevic, M, Orchowski, A, Schlossmacher, P, Thesen, A, Haider, M, Hartel, P
Published in Microscopy and microanalysis (01.08.2004)
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Published in Microscopy and microanalysis (01.08.2004)
Journal Article
Sub-Ångstrom and sub-eV resolution with the analytical SATEM
Benner, G., Matijevic, M., Orchowski, A., Schlossmacher, P., Thesen, A., Haider, M., Hartel, P.
Published in Microscopy and microanalysis (01.08.2004)
Published in Microscopy and microanalysis (01.08.2004)
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Journal Article
Performance of Monochromized and Aberration-Corrected TEMs
Benner, Gerd, Essers, Erik, Matijevic, Marko, Orchowski, Alexander, Schlossmacher, Peter, Thesen, Alexander, Haider, Maximilian, Hartel, Peter
Published in Microscopy and microanalysis (01.08.2004)
Published in Microscopy and microanalysis (01.08.2004)
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Journal Article
Artefacts in electron holography
Lichte, Hannes, Geiger, Dorin, Harscher, Alexander, Heindl, Eduard, Lehmann, Michael, Malamidis, Dimitrios, Orchowski, Alexander, Rau, Wolf-Dieter
Published in Ultramicroscopy (01.08.1996)
Published in Ultramicroscopy (01.08.1996)
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Journal Article
Corrected OMEGA In-column Energy Filter in Practice: Energy Resolution and Stability
Benner, Gerd, Essers, Erik, Huber, Bernd, Lang, Guenter, Matijevic, Marko, Orchowski, Alexander, Rau, Wolf Dieter, Schindler, Bernd, Schlossmacher, Peter, Thesen, Alexander
Published in Microscopy and microanalysis (01.08.2004)
Published in Microscopy and microanalysis (01.08.2004)
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Journal Article
Configuring load control system
SANJEEV KUMAR, NILL JOHN, EVANS CHRISTINE, CASEY CRAIG ALAN, JONES CHRISTOPHER MATTHEW, ORCHOWSKI NEIL R, BARD BENJAMIN F, PROTZMAN BRENT, ERICA L.KRAMER
Year of Publication 24.10.2023
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Year of Publication 24.10.2023
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