Architectures for silicon nanoelectronics and beyond
Bahar, R.I., Lau, C., Hammerstrom, D., Marculescu, D., Harlow, J., Orailoglu, A., Joyner, W.H., Pedram, M.
Published in Computer (Long Beach, Calif.) (01.01.2007)
Published in Computer (Long Beach, Calif.) (01.01.2007)
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Journal Article
Low-power instruction bus encoding for embedded processors
Petrov, P., Orailoglu, A.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.08.2004)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.08.2004)
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Journal Article
VLSI-SoC: at the crossroads of emerging trends : 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and extended selected papers
Orailoglu, Alex, Ugurdag, H. Fatih, Silveira, Luis Miguel, Margala, Martin, Reis, Ricardo
Year of Publication 25.09.2015
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Year of Publication 25.09.2015
eBook
Circularscan: a scan architecture for test cost reduction
Arslan, B., Orailoglu, A.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)
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Conference Proceeding
Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test
Makris, Y., Bayraktaroglu, I., Orailoglu, A.
Published in IEEE transactions on reliability (01.06.2004)
Published in IEEE transactions on reliability (01.06.2004)
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Journal Article
Test power reduction through minimization of scan chain transitions
Sinanoglu, O., Bayraktaroglu, I., Orailoglu, A.
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
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Conference Proceeding