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Year of Publication 04.06.2021
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Year of Publication 27.05.2019
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A Novel Depletion-IMOS (DIMOS) Device With Improved Reliability and Reduced Operating Voltage
Onal, C., Woo, R., Koh, H.-Y.S., Griffin, P.B., Plummer, J.D.
Published in IEEE electron device letters (01.01.2009)
Published in IEEE electron device letters (01.01.2009)
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Statistical Retardation Delay of I-MOS and Its Measurement Using TDR
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Published in IEEE electron device letters (01.02.2011)
Published in IEEE electron device letters (01.02.2011)
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