Determination of the stress level for voltage screen of integrated circuits
Kho, R.M., Moonen, A.J., Girault, V.M., Bisschop, J., Olthof, E.H.T., Nath, S., Liang, Z.N.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes
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Journal Article
Conference Proceeding
The rovibrational ν2 Raman spectrum of ammonia: a comparison of theory and experiment
Wormer, P.E.S., Olthof, E.H.T., Engeln, R.A.H., Reuss, J.
Published in Chemical physics (15.12.1993)
Published in Chemical physics (15.12.1993)
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Is (NH 3) 2 hydrogen bonded?
Olthof, E.H.T., van der Avoird, A., Wormer, P.E.S.
Published in Journal of molecular structure. Theochem (20.04.1994)
Published in Journal of molecular structure. Theochem (20.04.1994)
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Journal Article