Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology
Olson, B.D., Amusan, O.A., Dasgupta, S., Massengill, L.W., Witulski, A.F., Bhuva, B.L., Alles, M.L., Warren, K.M., Ball, D.R.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis
Olson, B.D., Holman, W.T., Massengill, L.W., Bhuva, B.L.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
Warren, K.M., Weller, R.A., Mendenhall, M.H., Reed, R.A., Ball, D.R., Howe, C.L., Olson, B.D., Alles, M.L., Massengill, L.W., Schrimpf, R.D., Haddad, N.F., Doyle, S.E., McMorrow, D., Melinger, J.S., Lotshaw, W.T.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops
Loveless, T.D., Olson, B.D., Bhuva, B.L., Holman, W.T., Hafer, C.C., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs
Olson, Brian D., Holman, W. Timothy, Massengill, Lloyd W., Bhuva, Bharat L., Fleming, Patrick R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Single-Event Transient Error Characterization of a Radiation-Hardened by Design 90 nm SerDes Transmitter Driver
Armstrong, S.E., Olson, B.D., Popp, J., Braatz, J., Loveless, T.D., Holman, W.T., McMorrow, D., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Control of bacterial canker on sour cherries, 1981 [Cherry, sour (Prunus cerasus 'Montmorency'), bacterial canker; Pseudomonas syringae pv. morsprunorum]
Olson B.D, Jones A.L
Published in Fungicide and nematicide tests; results American Phytopathological Society (1982)
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Published in Fungicide and nematicide tests; results American Phytopathological Society (1982)
Journal Article
Control of bacterial canker and cherry leaf spot on sour cherries, 1980 [Cherry, sour (Prunus cerasus 'Montmorency'), bacterial canker; Pseudomonas syringae pv. morsprunorum, cherry leaf spot; Coccomyces hiemalis]
Olson B.D, Jones A.L
Published in Fungicide and Nematicide Tests; Results American Phytopathological Society (1981)
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Published in Fungicide and Nematicide Tests; Results American Phytopathological Society (1981)
Journal Article