Dynamics of annular bright field imaging in scanning transmission electron microscopy
Findlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y.
Published in Ultramicroscopy (01.06.2010)
Published in Ultramicroscopy (01.06.2010)
Get full text
Journal Article
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images
E, H., MacArthur, K.E., Pennycook, T.J., Okunishi, E., D'Alfonso, A.J., Lugg, N.R., Allen, L.J., Nellist, P.D.
Published in Ultramicroscopy (01.10.2013)
Published in Ultramicroscopy (01.10.2013)
Get full text
Journal Article
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
Okunishi, E, Ishikawa, I, Sawada, H, Hosokawa, F, Hori, M, Kondo, Y
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
Get full text
Journal Article
Self-accommodation of B19′ martensite in Ti-Ni shape memory alloys - Part II. Characteristic interface structures between habit plane variants
Nishida, M., Okunishi, E., Nishiura, T., Kawano, H., Inamura, T., Ii, S., Hara, T.
Published in Philosophical magazine (Abingdon, England) (11.06.2012)
Published in Philosophical magazine (Abingdon, England) (11.06.2012)
Get full text
Journal Article
The dissociation of the [a + c] dislocation in GaN
Hirsch, P.B., Lozano, J.G., Rhode, S., Horton, M.K., Moram, M.A., Zhang, S., Kappers, M.J., Humphreys, C.J., Yasuhara, A., Okunishi, E., Nellist, P.D.
Published in Philosophical magazine (Abingdon, England) (30.09.2013)
Published in Philosophical magazine (Abingdon, England) (30.09.2013)
Get full text
Journal Article
Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary
Findlay, S.D., Azuma, S., Shibata, N., Okunishi, E., Ikuhara, Y.
Published in Ultramicroscopy (01.03.2011)
Published in Ultramicroscopy (01.03.2011)
Get full text
Journal Article
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride
Lozano, J G, Yang, H, Guerrero-Lebrero, M P, D'Alfonso, A J, Yasuhara, A, Okunishi, E, Zhang, S, Humphreys, C J, Allen, L J, Galindo, P L, Hirsch, P B, Nellist, P D
Published in Physical review letters (24.09.2014)
Published in Physical review letters (24.09.2014)
Get more information
Journal Article
Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM
Watanabe, M., Sasaki, T., Jimbo, Y., Okunishi, E., Sawada, H.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
Get full text
Journal Article
Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices
Phillips, P.J., Longo, P., Okunishi, E., Klie, R.F.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
Get full text
Journal Article
Development of a high-efficiency DF-STEM detector
Kaneko, T, Saitow, A, Fujino, T, Okunishi, E, Sawada, H
Published in Journal of physics. Conference series (01.01.2014)
Published in Journal of physics. Conference series (01.01.2014)
Get full text
Journal Article
Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy
Inamoto, S., Yamasaki, J., Okunishi, E., Kakushima, K., Iwai, H., Tanaka, N.
Published in Journal of applied physics (15.06.2010)
Published in Journal of applied physics (15.06.2010)
Get full text
Journal Article
Resolving 45 pm with 300 kV Aberration Corrected STEM
Sawada, H., Shimura, N., Satoh, K., Okunishi, E., Hosokawa, F., Shibata, N., Ikuhara, Y.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
Get full text
Journal Article
A dissociation mechanism for the [a+c] dislocation in GaN
Nellist, P D, Hirsch, P B, Rhode, S, Horton, M K, Lozano, J G, Yasuhara, A, Okunishi, E, Zhang, S, Sahonta, S-L, Kappers, M J, Humphreys, C J, Moram, M A
Published in Journal of physics. Conference series (11.06.2014)
Published in Journal of physics. Conference series (11.06.2014)
Get full text
Journal Article
Spherical aberration corrected STEM studies of Ge nanodots grown on Si(0 01) surfaces with an ultrathin SiO2 coverage
TANAKA, N, CHO, S.-P, SHKIYAEV, A. A, YAMASAKI, J, OKUNISHI, E, ICHIKAWA, M
Published in Applied surface science (30.09.2008)
Published in Applied surface science (30.09.2008)
Get full text
Conference Proceeding
Journal Article
Ferric iron in Al-bearing post-perovskite
Sinmyo, Ryosuke, Hirose, Kei, St. C. O'Neill, Hugh, Okunishi, Eiji
Published in Geophysical research letters (01.06.2006)
Published in Geophysical research letters (01.06.2006)
Get full text
Journal Article