GaAs Porous Films Electroetching Improvement By Using a Fuzzy Controller
Oksanich, A.P., Pritchin, S.E., Kogdas, M.G., Dernova, M.G.
Published in 2019 IEEE 9th International Conference Nanomaterials: Applications & Properties (NAP) (01.09.2019)
Published in 2019 IEEE 9th International Conference Nanomaterials: Applications & Properties (NAP) (01.09.2019)
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Conference Proceeding
Pd/Porous GaAs in the Manufacture of Schottky Diodes
Oksanich, A.P., Pritchin, S.E., Kogdas, M.G., Kholod, A.G., Dernova, M.G.
Published in 2019 IEEE International Conference on Modern Electrical and Energy Systems (MEES) (01.09.2019)
Published in 2019 IEEE International Conference on Modern Electrical and Energy Systems (MEES) (01.09.2019)
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Conference Proceeding
DEVICE FOR MEASURING GEOMETRIC PARAMETERS OF OBJECTS
OKSANICH A.P.,SU, SKAKOVSKIJ I.I.,SU, BABADZHANOV L.S.,SU, DANELYAN A.G.,SU
Year of Publication 15.02.1988
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Year of Publication 15.02.1988
Patent
METHOD OF PRODUCING STANDARD MEASURE OF THICKNESS OF SEMICONDUCTOR LAYERS
OKSANICH A.P.,SU, SPEKTR S.A.,SU, TUZOVSKIJ A.M.,SU, SHAPOVAL V.YA.,SU, BABADZHANOV L.S.,SU
Year of Publication 07.11.1991
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Year of Publication 07.11.1991
Patent