An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time
Oh, Hyunggoy, Han, Taewoo, Choi, Inhyuk, Kang, Sungho
Published in IEEE transactions on computers (01.01.2017)
Published in IEEE transactions on computers (01.01.2017)
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Journal Article
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Published in 2014 IEEE 23rd Asian Test Symposium (01.11.2014)
Published in 2014 IEEE 23rd Asian Test Symposium (01.11.2014)
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Conference Proceeding
Thermal Aware Test Scheduling for NTV Circuit
Lim, Jaeil, Oh, Hyunggoy, Kim, Heetae, Kang, Sungho
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2018)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2018)
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Journal Article
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit
Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Published in 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (01.10.2016)
Published in 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (01.10.2016)
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Conference Proceeding
A new online test and debug methodology for automotive camera image processing system
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
Published in 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (01.10.2016)
Published in 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (01.10.2016)
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Conference Proceeding
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost
Choi, Inhyuk, Oh, Hyunggoy, Lee, Young-Woo, Kang, Sungho
Published in IEEE transactions on computers (01.12.2018)
Published in IEEE transactions on computers (01.12.2018)
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Journal Article
Process variation-aware bridge fault analysis
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
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Conference Proceeding
An online test and debug methodology for automotive image processing system
Hyunggoy Oh, Inhyuk Choi, Taewoo Han, Won Jung, Byungin Moon, Sungho Kang
Published in 2014 International SoC Design Conference (ISOCC) (01.11.2014)
Published in 2014 International SoC Design Conference (ISOCC) (01.11.2014)
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Conference Proceeding
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density
Cho, Kyunghwan, Kim, Jihye, Oh, Hyunggoy, Lee, Sangjun, Kang, Sungho
Published in 2019 International SoC Design Conference (ISOCC) (06.10.2019)
Published in 2019 International SoC Design Conference (ISOCC) (06.10.2019)
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Conference Proceeding
Low Power Scan Chain Architecture Based on Circuit Topology
Kim, Heetae, Oh, Hyunggoy, Lee, Sangjun, Kang, Sungho
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
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Conference Proceeding
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test
Oh, Hyunggoy, Kim, Heetae, Lee, Sangjun, Kang, Sungho
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
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Conference Proceeding
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design
Oh, Hyunggoy, Kim, Heetae, Lim, Jaeil, Kang, Sungho
Published in 2017 International SoC Design Conference (ISOCC) (01.11.2017)
Published in 2017 International SoC Design Conference (ISOCC) (01.11.2017)
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Conference Proceeding