Evaluation of Long-Term Reliability and Overcurrent Capabilities of 15-kV SiC MOSFETs and 20-kV SiC IGBTs During Narrow Current Pulsed Conditions
Kim, Matthew, Forbes, J. J., Hirsch, Emily A., Schrock, James, Lacouture, Shelby, Bilbao, Argenis, Bayne, Stephen B., O'Brien, Heather K., Ogunniyi, Aderinto A.
Published in IEEE transactions on plasma science (01.11.2020)
Published in IEEE transactions on plasma science (01.11.2020)
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Journal Article
Physics-based simulation of 4H-SIC DMOSFET structure under inductive switching
Pushpakaran, Bejoy N., Bayne, Stephen B., Ogunniyi, Aderinto A.
Published in Journal of computational electronics (01.03.2016)
Published in Journal of computational electronics (01.03.2016)
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Journal Article
An evaluation system for experimental silicon and silicon carbide super gate turn off thyristors
Bayne, Stephen, Lacouture, Shelby, Lawson, Kevin, Giesselmann, Michael, Scozzie, Charles J, O'Brien, Heather, Ogunniyi, Aderinto A
Published in Review of scientific instruments (01.07.2014)
Published in Review of scientific instruments (01.07.2014)
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Journal Article
Automated modular high energy evaluation system for experimental thyristor devices
Lacouture, Shelby, Lawson, Kevin, Bayne, Stephen, Giesselmann, Michael, Scozzie, Charles J, O'Brien, Heather, Ogunniyi, Aderinto A
Published in Review of scientific instruments (01.10.2013)
Published in Review of scientific instruments (01.10.2013)
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Journal Article
Sub-Millisecond Transient Analysis of High Voltage SiC MOSFET and High Voltage SiC IGBT
Ogunniyi, Aderinto A., O'Brien, Heather, Hinojosa, Miguel
Published in 2023 IEEE Pulsed Power Conference (PPC) (25.06.2023)
Published in 2023 IEEE Pulsed Power Conference (PPC) (25.06.2023)
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Conference Proceeding
Physics based electro-thermal transient simulation of 4H-SiC JBS diode using Silvaco ATLAS
Pushpakaran, Bejoy N., Bayne, Stephen B., Ogunniyi, Aderinto A.
Published in 2015 IEEE Pulsed Power Conference (PPC) (01.05.2015)
Published in 2015 IEEE Pulsed Power Conference (PPC) (01.05.2015)
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Conference Proceeding
Analysis of carrier lifetime effects on HV SIC PiN diodes at elevated pulsed switching conditions
Ogunniyi, Aderinto A., O'Brien, Heather K., Hinojosa, Miguel, Cheng, Lin, Scozzie, Charles J., Pushpakaran, Bejoy N., Lacouture, Shelby, Bayne, Stephen B.
Published in 2015 IEEE Pulsed Power Conference (PPC) (01.05.2015)
Published in 2015 IEEE Pulsed Power Conference (PPC) (01.05.2015)
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Conference Proceeding
Electro thermal transient simulation of silicon carbide power MOSFET
Pushpakaran, Bejoy N., Bayne, Stephen B., Ogunniyi, Aderinto A.
Published in 2013 Abstracts IEEE International Conference on Plasma Science (ICOPS) (01.06.2013)
Published in 2013 Abstracts IEEE International Conference on Plasma Science (ICOPS) (01.06.2013)
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Conference Proceeding
Silvaco based electro-thermal analysis of 4H-SiC TIV-JFET structure under extremely high current density resistive switching
Pushpakaran, Bejoy N., Bayne, Stephen B., Ogunniyi, Aderinto A.
Published in 2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC) (01.07.2016)
Published in 2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC) (01.07.2016)
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Conference Proceeding
Electro-thermal transient simulation of silicon carbide power MOSFET
Pushpakaran, Bejoy N., Bayne, Stephen B., Ogunniyi, Aderinto A.
Published in 2013 19th IEEE Pulsed Power Conference (PPC) (01.06.2013)
Published in 2013 19th IEEE Pulsed Power Conference (PPC) (01.06.2013)
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Conference Proceeding
Wide injection range OCVD system for lifetime spectroscopy techniques
Lacouture, Shelby, Schrock, James, Hirsch, Emily, Bayne, Stephen, O'Brien, Heather, Ogunniyi, Aderinto A.
Published in 2017 IEEE 21st International Conference on Pulsed Power (PPC) (01.06.2017)
Published in 2017 IEEE 21st International Conference on Pulsed Power (PPC) (01.06.2017)
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Conference Proceeding