Stress analysis in tungsten and Si(3)N(4) coated silicon wafers
Ogilvie, R E, Nicolich, J
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.08.2009)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.08.2009)
Get full text
Journal Article
Analytical applications of a combined electron microscope/electron microanalyzer
Schippert, M. A, Moll, Sheldon H, Ogilvie, Robert E
Published in Analytical chemistry (Washington) (01.07.1967)
Published in Analytical chemistry (Washington) (01.07.1967)
Get full text
Journal Article
Fusing Mechanism of Nichrome-Linked Programmable Read-Only Memory Devices
Kenney, G. B., Jones, W. Kinzy, Ogilvie, R. E.
Published in 14th International Reliability Physics Symposium (01.04.1976)
Published in 14th International Reliability Physics Symposium (01.04.1976)
Get full text
Conference Proceeding