Random Telegraph Signal in Flash Memory: Its Impact on Scaling of Multilevel Flash Memory Beyond the 90-nm Node
Kurata, H., Otsuga, K., Kotabe, A., Kajiyama, S., Osabe, T., Sasago, Y., Narumi, S., Tokami, K., Kamohara, S., Tsuchiya, O.
Published in IEEE journal of solid-state circuits (01.06.2007)
Published in IEEE journal of solid-state circuits (01.06.2007)
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Journal Article
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope
Morishita, Hideo, Ohshima, Takashi, Otsuga, Kazuo, Kuwahara, Makoto, Agemura, Toshihide, Ose, Yoichi
Published in Ultramicroscopy (01.11.2021)
Published in Ultramicroscopy (01.11.2021)
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Journal Article
Anomalously Large Threshold Voltage Fluctuation by Complex Random Telegraph Signal in Floating Gate Flash Memory
Tega, N., Miki, H., Osabe, T., Kotabe, A., Otsuga, K., Kurata, H., Kamohara, S., Tokami, K., Ikeda, Y., Yamada, R.
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
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Conference Proceeding
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor
Nomura, Takao, Mori, Ryo, Ito, Munehiro, Takayanagi, Koji, Ochiai, Toshihiko, Fukuoka, Kazuki, Otsuga, Kazuo, Nii, Koji, Morita, Sadayuki, Hashimoto, Tomoaki, Kida, Tsuyoshi, Yamada, Junichi, Tanaka, Hideki
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
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Conference Proceeding
A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process
Onouchi, M., Otsuga, K., Igarashi, Y., Ikeya, T., Morita, S., Ishibashi, K., Yanagisawa, K.
Published in IEEE Asian Solid-State Circuits Conference 2011 (01.11.2011)
Published in IEEE Asian Solid-State Circuits Conference 2011 (01.11.2011)
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Conference Proceeding
An on-chip 250 mA 40 nm CMOS digital LDO using dynamic sampling clock frequency scaling with offset-free TDC-based voltage sensor
Otsuga, K., Onouchi, M., Igarashi, Y., Ikeya, T., Morita, S., Ishibashi, K., Yanagisawa, K.
Published in 2012 IEEE International SOC Conference (01.09.2012)
Published in 2012 IEEE International SOC Conference (01.09.2012)
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Conference Proceeding