by Ostermaier, C., Lagger, P., Reiner, M., Pogany, D.
Published in Microelectronics and reliability (01.03.2018)

by Stabentheiner, M., Diehle, P., Hübner, S., Lejoyeux, M., Altmann, F., Neumann, R., Taylor, A. A., Pogany, D., Ostermaier, C.
Published in Journal of applied physics (14.01.2024)

by Wieland, D., Ofner, S., Stabentheiner, M., Butej, B., Koller, C., Sun, J., Minetto, A., Reiser, K., Haberlen, O., Nelhiebel, M., Glavanovics, M., Pogany, D., Ostermaier, C.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Alexewicz, A., Ostermaier, C., Henkel, C., Bethge, O., Carlin, J.-F., Lugani, L., Grandjean, N., Bertagnolli, E., Pogany, D., Strasser, G.
Published in Thin solid films (31.07.2012)

by Ostermaier, C., Pozzovivo, G., Carlin, J.-F., Basnar, B., Schrenk, W., Douvry, Y., Gaquiere, C., DeJaeger, J.-C., Cico, K., Frohlich, K., Gonschorek, M., Grandjean, N., Strasser, G., Pogany, D., Kuzmik, J.
Published in IEEE electron device letters (01.10.2009)

by ABERMANN, S, POZZOVIVO, G, BERTAGNOLLI, E, KUZMIK, J, OSTERMAIER, C, HENKEL, C, BETHGE, O, STRASSER, G, POGANY, D, CARLIN, J.-F, GRANDJEAN, N
Published in Electronics letters (2009)

by Grill, A., Rzepa, G., Lagger, P., Ostermaier, C., Ceric, Hajdin, Grasser, T.
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)

by Ostermaier, C., Lee, H.-C., Hyun, S.-Y., Ahn, S.-I., Kim, K.-W., Cho, H.-I., Ha, J.-B., Lee, J.-H.
Published in Physica status solidi. C (01.05.2008)

by Wanzenboeck, H.D., Ostermaier, C., Gruen, A., Eichinger, B., Karner, M., Bertagnolli, E.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.01.2006)

by Nardo, A., De Santi, C., Koller, C., Ostermaier, C., Daumiller, I., Meneghesso, G., Zanoni, E., Meneghini, M.
Published in Microelectronics and reliability (01.11.2021)

by Padovan, V., Koller, C., Pobegen, G., Ostermaier, C., Pogany, D.
Published in Microelectronics and reliability (01.09.2019)

by Stabentheiner, M., Diehle, P., Altmann, F., Hübner, S., Lejoyeux, M., Taylor, A.A., Wieland, D., Pogany, D., Ostermaier, C.
Published in Microelectronics and reliability (01.11.2023)

by Reisinger, M., Ostermaier, C., Tomberger, M., Zechner, J., Sartory, B., Ecker, W., Daumiller, I., Keckes, J.
Published in Scripta materialia (01.04.2018)

by Reiner, M., Lagger, P., Prechtl, G., Steinschifter, P., Pietschnig, R., Pogany, D., Ostermaier, C.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Grill, A., Stampfer, B., Im, Ki-Sik, Lee, J.-H., Ostermaier, C., Ceric, H., Waltl, M., Grasser, T.
Published in Solid-state electronics (01.06.2019)

by Lagger, P., Ostermaier, C., Pogany, D.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Capriotti, M., Bahat Treidel, E., Fleury, C., Bethge, O., Ostermaier, C., Rigato, M., Lancaster, S.L.C., Brunner, F., Detz, H., Hilt, O., Würfl, J., Pogany, D., Strasser, G.
Published in Solid-state electronics (01.11.2016)

by Kuzmik, J., Ostermaier, C., Pozzovivo, G., Basnar, B., Schrenk, W., Carlin, J.F., Gonschorek, M., Feltin, E., Grandjean, N., Douvry, Y., Gaquière, Christophe, de Jaeger, Jean-Claude, Cico, K., Frölich, K., Skriniarova, J., Kovacs, J., Strasser, G., Pogany, D., Gornik, E.
Published in IEEE transactions on electron devices (01.09.2010)

by Grill, A., Stampfer, B., Waltl, M., Ki-Sik Im, Lee, J.-H, Ostermaier, C., Ceric, H., Grasser, T.
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by ALEXEWICZ, A, OSTERMAIER, C, HENKEL, C, BETHGE, O, CARLIN, J.-F, LUGANI, L, GRANDJEAN, N, BERTAGNOLLI, E, POGANY, D, STRASSER, G
Published in Thin solid films (2012)