Search Results - "OSE, YOICHI" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

A cryo-TSEM with temperature cycling capability allows deep sublimation of ice to uncover fine structures in thick cells

A cryo-TSEM with temperature cycling capability allows deep sublimation of ice to uncover fine structures in thick cells

by Usukura, Jiro, Narita, Akihiro, Matsumoto, Tomoharu, Usukura, Eiji, Sunaoshi, Takeshi, Watanabe, Syunya, Tamba, Yusuke, Nagakubo, Yasuhira, Mizuo, Takashi, Azuma, Junzo, Osumi, Masako, Nimura, Kazutaka, Tamochi, Ryuichiro, Ose, Yoichi
Published in Scientific reports (01.11.2021)

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Journal Article

On the Design of Electron Lenses 2

On the Design of Electron Lenses 2

by Ose, Yoichi, Yonezawa, Akira
Published in KENBIKYO (30.04.2017)

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Journal Article

$Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction I: observation of anisotropic diffraction image$

Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction I: observation of anisotropic diffraction image

by Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo
Published in Chemical physics letters (13.02.2002)

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Journal Article

On the Design of Electron Lenses 1

On the Design of Electron Lenses 1

by Fujita, Shin, Ose, Yoichi
Published in KENBIKYO (30.12.2016)

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Journal Article

Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope

Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope

by Morishita, Hideo, Ohshima, Takashi, Otsuga, Kazuo, Kuwahara, Makoto, Agemura, Toshihide, Ose, Yoichi
Published in Ultramicroscopy (01.11.2021)

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Journal Article

$Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction II: analysis of anisotropic diffraction image$

Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction II: analysis of anisotropic diffraction image

by Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo
Published in Chemical physics letters (13.02.2002)

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Journal Article

ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD THEREOF

ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD THEREOF

by TAKANE Daichi, OSE Yoichi, OHSHIMA Takashi, IDE Tatsuro, MORISHITA Hideo
Year of Publication 28.12.2023

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Patent

Direct Observation of Field Emission Sites in a Single Multiwalled Carbon Nanotube by Lorenz Microscopy

Direct Observation of Field Emission Sites in a Single Multiwalled Carbon Nanotube by Lorenz Microscopy

by Fujieda, Tadashi, Hidaka, Kishio, Hayashibara, Mituo, Kamino, Takeo, Ose, Yoichi, Abe, Hidekazu, Shimizu, Tetuo, Tokumoto, Hiroshi
Published in Japanese Journal of Applied Physics (01.04.2005)

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Journal Article

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

by OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, KUWAHARA Makoto, MORISHITA Hideo
Year of Publication 30.06.2022

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Patent

전자 현미경

전자 현미경

by MORISHITA HIDEO, HATANO MICHIO, KATANE JUNICHI, AGEMURA TOSHIHIDE, OSE YOICHI, TAKAGUCHI KATSURA, OHSHIMA TAKASHI
Year of Publication 29.01.2024

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Patent

APPLIED ELECTRON BEAM DEVICE AND ELECTRON BEAM GENERATION METHOD

APPLIED ELECTRON BEAM DEVICE AND ELECTRON BEAM GENERATION METHOD

by TAKANE Daichi, KATANE Junichi, OSE Yoichi, OHSHIMA Takashi, IDE Tatsuro, MORISHITA Hideo
Year of Publication 07.12.2023

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Patent

ELECTRON MICROSCOPE

ELECTRON MICROSCOPE

by KATANE Junichi, TAKAGUCHI Katsura, OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, HATANO Michio, MORISHITA Hideo
Year of Publication 09.03.2023

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Patent

ELECTRON BEAM APPLICATION DEVICE

ELECTRON BEAM APPLICATION DEVICE

by KATANE Junichi, OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, KOHMU Naohiro, IDE Tatsuro, MORISHITA Hideo
Year of Publication 20.10.2022

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Patent

ELECTRON BEAM APPLICATION DEVICE

ELECTRON BEAM APPLICATION DEVICE

by KATANE Junichi, OSE Yoichi, OHSHIMA Takashi, SHICHI Hiroyasu, IDE Tatsuro, MORISHITA Hideo
Year of Publication 19.05.2022

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Patent

Simulation for the Development of Electron Guns and Detection Systems of Modern Field Emission Scanning Electron Microscopes

Simulation for the Development of Electron Guns and Detection Systems of Modern Field Emission Scanning Electron Microscopes

by Ose, Yoichi, Sato, Hirofumi, Morishita, Hideo, Kohashi, Teruo
Published in Microscopy and microanalysis (01.06.2015)

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Journal Article

ELECTRON GUN AND ELECTRON MICROSCOPE

ELECTRON GUN AND ELECTRON MICROSCOPE

by KATANE Junichi, AGEMURA Toshihide, OSE Yoichi, OHSHIMA Takashi, KOHMU Naohiro, IDE Tatsuro, MORISHITA Hideo
Year of Publication 30.09.2021

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Patent

ELECTRON GUN AND ELECTRON-BEAM APPLICATION DEVICE

ELECTRON GUN AND ELECTRON-BEAM APPLICATION DEVICE

by KATANE Junichi, OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, KOHMU Naohiro, ENYAMA Momoyo, IDE Tatsuro, MORISHITA Hideo
Year of Publication 06.05.2021

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Patent

Development of an Easy-to-Use Cryo-Electron Microscope for Simultaneous Observation of SEM and Transmission Images

Development of an Easy-to-Use Cryo-Electron Microscope for Simultaneous Observation of SEM and Transmission Images

by Ose, Yoichi, Sunaoshi, Takeshi, Tamba, Yusuke, Nagakubo, Yasuhira, Azuma, Junzo, Tamochi, Ryuichiro, Narita, Akihiro, Matsumoto, Tomoharu, Usukura, Eiji, Usukura, Jiro, Osumi, Masako
Published in Microscopy and microanalysis (01.08.2018)

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Journal Article

SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

by KAWANAMI YOSHIMI, OSE YOICHI
Year of Publication 13.06.2013

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Patent

ELECTRON BEAM APPLICATION DEVICE

ELECTRON BEAM APPLICATION DEVICE

by NOMAGUCHI Tsunenori, OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, IDE Tatsuro, MORISHITA Hideo
Year of Publication 06.08.2020

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Patent

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