Method for controlling different models of electronic logic circuit, involves measuring and collecting test step between test points of time durations for circuit models based on measured period of time difference between circuit model
OPRICA, DANIEL, GHAMESHLU, MAJID, FISCHER, BERNHARD, HINTERSTOISSER, THOMAS, MATSCHNIG, MARTIN
Year of Publication 27.03.2014
Get full text
Year of Publication 27.03.2014
Patent